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Singanallur Venkatakrishnan

Oak Ridge National Laboratory

16H-index
120Paper Count
2.1KCitation Count
Published Papers 15
Publication Date
Simulation driven adaptive sampling for neutron-diffraction based strain mapping of additively manufactured parts*
err2025-11-06
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errOAAI
errVenkatakrishnan S V; Ke An; Yousub Lee; Thomas Feldhausen; Lauren Heinrich; Stephen DeWitt
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Combining Deep Learning and scatterControl for High-Throughput X-ray CT Based Non-Destructive Characterization of Large-Scale Casted Metallic Components
err2025-10-21
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errOAAI
errAmirkoushyar Ziabari; Mohamed Hakim Bedhief; Obaidullah Rahman; Singanallur Venkatakrishnan; Paul Brackman; Peter Katuch
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Deep Learning Based Sinogram Inpainting for Fast and High-quality Artifact Correction in Electron Tomography
err2025-07-25
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errOAAI
errObaidullah Rahman; Singanallur Venkatakrishnan; David A Cullen; Amirkoushyar Ziabari
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Model-based iterative reconstruction with adaptive regularization for artifact reduction in electron tomography
err2025-02-18
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errOAAI
errVenkatakrishnan, Singanallur; Rahman, Obaidullah; Amichi, Lynda; Arregui-Mena, Jose D.; Yu, Haoran; Cullen, David A.; Ziabari, Amirkoushyar
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Fast Hyperspectral Neutron Tomography
err2025-01-01
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PREAI
errMohammad Samin Nur Chowdhury; Diyu Yang; Shimin Tang; Singanallur V. Venkatakrishnan; Hassina Z. Bilheux; Gregery T. Buzzard; Charles A. Bouman
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A machine learning decision criterion for reducing scan time for hyperspectral neutron computed tomography systems
err2024-07-02
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errOAAI
errTang, Shimin; Venkatakrishnan, Singanallur V.; Chowdhury, Mohammad S. N.; Yang, Diyu; Gober, Megan; Nelson, George J.; Cekanova, Maria; Biris, Alexandru S.; Buzzard, Gregery T.; Bouman, Charles A.; Skorpenske, Harley D.; Bilheux, Hassina Z.
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Enabling rapid X-ray CT characterisation for additive manufacturing using CAD models and deep learning-based reconstruction
err2023-05-30
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errOAAI
errZiabari, Amirkoushyar; Venkatakrishnan, S. V.; Snow, Zackary; Lisovich, Aleksander; Sprayberry, Michael; Brackman, Paul; Frederick, Curtis; Bhattad, Pradeep; Graham, Sarah; Bingham, Philip; Dehoff, Ryan; Plotkowski, Alex; Paquit, Vincent
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Validating the Use of Gaussian Process Regression for Adaptive Mapping of Residual Stress Fields
err2023-05-20
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errOAAI
errFancher, Chris M.; Venkatakrishnan, Singanallur; Feldhausen, Thomas; Saleeby, Kyle; Plotkowski, Alex
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Adaptive sampling for accelerating neutron diffraction-based strain mapping *
err2023-04-05
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errOAAI
errVenkatakrishnan, S. V.; Fancher, Chris M.; Ziatdinov, Maxim; Vasudevan, Rama; Saleeby, Kyle; Haley, James; Yu, Dunji; An, Ke; Plotkowski, Alex
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Algorithm-Driven Advances for Scientific CT Instruments: From model-based to deep learning-based approaches
err2022-01-01
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errOAAI
errVenkatakrishnan, S. V.; Mohan, K. Aditya; Ziabari, Amir Koushyar; Bouman, Charles A.
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Convolutional neural network based non-iterative reconstruction for accelerating neutron tomography *
err2021-04-14
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errOAAI
errVenkatakrishnan, Singanallur; Ziabari, Amirkoushyar; Hinkle, Jacob; Needham, Andrew W.; Warren, Jeffrey M.; Bilheux, Hassina Z.
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MBIR: A cryo-ET 3D reconstruction method that effectively minimizes missing wedge artifacts and restores missing information
err2019-05-01
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errOAAI
errYan, Rui; Venkatakrishnan, Singanallur V.; Liu, Jun; Bouman, Charles A.; Jiang, Wen
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Robust X-Ray Phase Ptycho-Tomography
err2016-07-01
err17
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errVenkatakrishnan, Singanallur V.; Farmand, Maryam; Yu, Young-Sang; Majidi, Hasti; van Benthem, Klaus; Marchesini, Stefano; Shapiro, David A.; Hexemer, Alexander
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A Model Based Iterative Reconstruction Algorithm For High Angle Annular Dark Field-Scanning Transmission Electron Microscope (HAADF-STEM) Tomography
err2013-11-01
err72
PREAI
errVenkatakrishnan, S. V.; Drummy, Lawrence F.; Jackson, Michael A.; De Graef, Marc; Simmons, Jeff; Bouman, Charles A.
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