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Alexander L. Shluger

University College London

65H-index
433Paper Count
1.8WCitation Count
Published Papers 165
Publication Date
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Mesoscopic Modeling of Structure-Transport Relationships in Dense CNT Films Containing Amorphous Carbon
errACS Applied Electronic Materials
IF4.7
err2026-04-26
err0
PREAI
errYvelin Giret; Filippo Federici Canova; Al-Moatasem El-Sayed; Thomas R. Durrant; Rahul Sen; Harry Luan; Gennadi Bersuker; Alexander L. Shluger; David Z. Gao
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H–Cu vacancy Co-segregation and H diffusion in Cu grain boundaries
errMaterials Today Communications
IF4.5
err2026-02-06
err0
errOAAI
errVasileios Fotopoulos; Alexander L. Shluger
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errSave
Structure and Dynamics of Water Confined at the SiO2/WS2 Interface
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2025-02-17
err0
PREAI
errMilton, Katherine L.; Hargreaves, Laura; Shluger, Alexander
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Electron Ptychography for Atom-by-Atom Quantification of 1D Defect Complexes in Monolayer MoS2
errACS NANO
IF16
err2025-02-07
err0
PREAI
errLoh, L; Ning, SC; Kieczka, D; Chen, Y; Yang, JM; Wang, Z; Pennycook, SJ; Eda, G; Shluger, AL; Bosman, M
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Electronic structure and properties of trapped holes in crystalline and amorphous Ga2O3
errPHYSICAL REVIEW B
IF3.7
err2025-01-21
err0
PREAI
errKaewmeechai, Chaiyawat; Strand, Jack; Shluger, Alexander
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Reactions of Hydrogen-Passivated Silicon Vacancies in α-Quartz with Electron Holes and Hydrogen
errNANOMATERIALS
IF4.3
err2025-01-19
err0
errOAAI
errFreire, Teofilo Cobos; Strand, Jack; Shluger, Alexander L.
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Unveiling surface dynamics: in situ oxidation of defective WS2
errNANOSCALE
IF5.1
err2025-01-01
err0
errOAAI
errKieczka, Daria; Bussolotti, Fabio; Maddumapatabandi, Thathsara D.; Bosman, Michel; Shluger, Alexander
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Dielectric breakdown of oxide films in electronic devices (vol 9, pg 607, 2024)
errNATURE REVIEWS MATERIALS
IF86.2
err2024-10-30
err0
PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
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Role of local structure in the optical and electronic properties of oxygen vacancies in different crystal phases of Ga2O3
errPHYSICAL REVIEW MATERIALS
IF3.4
err2024-09-16
err2
errOAAI
errKaewmeechai, Chaiyawat; Strand, Jack; Shluger, Alexander
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Dielectric breakdown of oxide films in electronic devices
errNATURE REVIEWS MATERIALS
IF86.2
err2024-08-07
err2
PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
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errSave
Electron emission from deep traps in HfO 2 under thermal and optical excitation
errPHYSICAL REVIEW B
IF3.7
err2024-04-17
err1
errOAAI
errIzmailov, Roman; Strand, Jack; Ronchi, Nicolo; Shluger, Alexander; Afanas'ev, Valeri
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errSave
Modeling the Effects of Varying the Ti Concentration on the Mechanical Properties of Cu-Ti Alloys
errACS OMEGA
IF4.3
err2024-02-19
err1
errOAAI
errFotopoulos, Vasileios; O'Hern, Corey S.; Shattuck, Mark D.; Shluger, Alexander L.
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errSave
On the Structure of Oxygen Deficient Amorphous Oxide Films
errADVANCED SCIENCE
IF14.1
err2023-12-26
err6
errOAAI
errStrand, Jack; Shluger, Alexander L.
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errSave
Structure and Migration Mechanisms of Small Vacancy Clusters in Cu: A Combined EAM and DFT Study
errNANOMATERIALS
IF4.3
err2023-04-25
err1
errOAAI
errFotopoulos, Vasileios; Mora-Fonz, David; Kleinbichler, Manuel; Bodlos, Rishi; Kozeschnik, Ernst; Romaner, Lorenz; Shluger, Alexander L.
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errSave
Difference in Structure and Electronic Properties of Oxygen Vacancies in α-Quartz and α-Cristobalite Phases of SiO2
errMATERIALS
IF3.2
err2023-02-07
err8
errOAAI
errMilton, Katherine L.; Durrant, Thomas R.; Cobos Freire, Teofilo; Shluger, Alexander L.
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errSave
Unique Atomic and Electronic Structures of Oxygen Vacancies in Amorphous SnO2 from First Principles and Informatics
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2022-11-01
err5
PREAI
errKiyohara, Shin; Mora-Fonz, David; Shluger, Alexander; Kumagai, Yu; Oba, Fumiyasu
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errSave
Energies and structures of Cu/Nb and Cu/W interfaces from density functional theory and semi-empirical calculations
errMATERIALIA
IF2.9
err2022-03-01
err18
errOAAI
errBodlos, R.; Fotopoulos, V; Spitaler, J.; Shluger, A. L.; Romaner, L.
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errSave
Atomistic insight into the formation dynamics of charged point defects: A classical molecular dynamics study of F+-centers in NaCl
errPHYSICAL REVIEW MATERIALS
IF3.4
err2022-01-28
err3
errOAAI
errYuan, Shuaishuai; Kantorovich, Lev; Shluger, Alexander L.; Bevan, Kirk H.
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The nature of column boundaries in micro-structured silicon oxide nanolayers
errAPL MATERIALS
IF4.5
err2021-12-08
err4
errOAAI
errPatel, K.; Cottom, J.; Mehonic, A.; Ng, W. H.; Kenyon, A. J.; Bosman, M.; Shluger, A. L.
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Ultrasensitive hydrogen detection by electrostatically formed silicon nanowire decorated by palladium nanoparticles
errSENSORS AND ACTUATORS B-CHEMICAL
IF7.7
err2021-11-01
err16
errOAAI
errMukherjee, Anwesha; Gnaim, Mohamad; Tov, Idan Shem; Hargreaves, Laura; Hayon, Joseph; Shluger, Alexander; Rosenwaks, Yossi
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Research Directions

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Co-authors
Cooperation Journals
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