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A. Jabłoński

wroclaw university of science & technology

50H-index
352Paper Count
1.1WCitation Count
Published Papers 64
Publication Date
Surface Characterization of MoS2Atomic Layers Mechanically Exfoliated on a Si Substrate
err2020-08-14
err7
errOAAI
errKrawczyk, Miroslaw; Pisarek, Marcin; Szoszkiewicz, Robert; Jablonski, Aleksander
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Surface characterization of low-temperature grown yttrium oxide
err2018-04-01
err15
PREAI
errKrawczyk, Miroslaw; Lisowski, Wojciech; Pisarek, Marcin; Nikiforow, Kostiantyn; Jablonski, Aleksander
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Surface characterization of graphene based materials
err2016-12-01
err7
PREAI
errPisarek, M.; Holdynski, M.; Krawczyk, M.; Nowakowski, R.; Roguska, A.; Malolepszy, A.; Stobinski, L.; Jablonski, A.
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Surface studies of praseodymium by electron spectroscopies
err2016-12-01
err2
PREAI
errKrawczyk, Miroslaw; Pisarek, Marcin; Lisowski, Wojciech; Jablonski, Aleksander
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Arsenic chemical state in MBE grown epitaxial ZnO layers - doped with As, N and Sb
err2016-12-01
err11
PREAI
errPrzezdziecka, E.; Lisowski, W.; Jakiela, R.; Sobczak, J. W.; Jablonski, A.; Pietrzyk, M. A.; Kozanecki, A.
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Electron inelastic mean free paths in cerium dioxide
err2015-06-01
err31
PREAI
errKrawczyk, M.; Holdynski, M.; Lisowski, W.; Sobczak, J. W.; Jablonski, A.
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XPS method as a useful tool for studies of quantum well epitaxial materials: Chemical composition and thermal stability of InGaN/GaN multilayers
err2014-06-01
err5
PREAI
errLisowski, Wojciech; Grzanka, Ewa; Sobczak, Janusz W.; Krawczyk, Miroslaw; Jablonski, Aleksander; Czernecki, Robert; Leszczynski, Michal; Suski, Tadeusz
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