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K

Ki-Nam Joo

department of photonic engineering

17H-index
93Paper Count
828Citation Count
Published Papers 28
Publication Date
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Multi-Channeled Spectrometer Using a Concave Grating for High Resolution in the Wide Spectral Range
errInternational Journal of Precision Engineering and Manufacturing
IF3.6
err2026-07-20
err0
PREAI
errSeoyoon Lee; Jin Hee Cho; Ki-Nam Joo
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Assembly and performance evaluation of an optical spectrometer by using spectral interferometry
errMeasurement
IF5.6
err2025-07-07
err0
PREAI
errSeoyoon Lee; Seon Ile Seo; Ki-Nam Joo
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errSave
Deep learning-based single-shot lateral shearing interferometry
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2025-04-26
err0
errOAAI
errNguyen, Manh The; Park, Hyo-Mi; Joo, Ki-Nam; Ghim, Young-Sik
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errSave
Spectral imaging for 2-D wavelength mapping by chromatic phase retardation
errCIRP Annals
IF0
err2025-04-24
err0
PREAI
errKi-Nam Joo; Seongwook Jang
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errSave
A Simple Tunable Achromatic Quarter-Waveplate with the Combination of Wavelength-Dependent Waveplates
errprecision engineering journal of the international societies for precision engineering and nanotechnology
IF3.6
err2025-04-01
err0
PREAI
errKwon, Haehyuck; Seo, Seon Ile; Park, Jong-Rak; Joo, Ki-Nam
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errSave
Polarization-multiplexed snapshot lateral shearing interferometric sensor for surface roughness measurements
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2024-08-01
err0
PREAI
errPark, Hyo Mi; Mayer, Luke D.; Kim, Daewook; Joo, Ki-Nam
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errSave
Surface asymmetry measurements by single-shot cyclic azimuthal shearing interferometry
errCIRP ANNALS-MANUFACTURING TECHNOLOGY
IF3.6
err2024-01-01
err0
PREAI
errJoo, Ki-Nam; Park, Hyo Mi
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errSave
Dual Optical Measurement Probe System for Double-Sided Film Structure
errprecision engineering journal of the international societies for precision engineering and nanotechnology
IF3.6
err2022-07-29
err4
PREAI
errKwon, Uihyeok; Joo, Ki-Nam
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errSave
Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures
errMICROMACHINES
IF3
err2022-07-07
err5
errOAAI
errJoo, Ki-Nam; Park, Hyo-Mi
errShare
errSave
Flexible lateral shearing interferometry based on polarization gratings for surface figure metrology
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2022-07-01
err7
PREAI
errBin Jeong, Hyo; Park, Hyo Mi; Ghim, Young-Sik; Joo, Ki-Nam
errShare
errSave
Spherical wavefront measurement on modified cyclic radial shearing interferometry
errOPTICS EXPRESS
IF3.3
err2021-11-02
err3
errOAAI
errBian, Dian; Joo, Ki-Nam; Lu, Yang; Yu, Liandong
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errSave
Polarized imaging interpreter for simultaneous clocking metrology of multiple objects
errOPTICS LETTERS
IF3.3
err2021-09-30
err0
PREAI
errBin Jeong, Hyo; Park, Jong-Kyu; Kim, Daewook; Joo, Ki-Nam
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errSave
Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films
errOPTICS EXPRESS
IF3.3
err2021-07-26
err5
errOAAI
errGhim, Young-Sik; Seo, Yong Bum; Joo, Ki-Nam; Rhee, Hyug-Gyo
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errSave
Single-shot freeform surface profiler
errOPTICS EXPRESS
IF3.3
err2020-01-24
err23
errOAAI
errSeo, Yong Bum; Jeong, Hyo Bin; Rhee, Hyug-Gyo; Ghim, Young-Sik; Joo, Ki-Nam
errShare
errSave
Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry
errSENSORS
IF3.5
err2019-11-21
err18
errOAAI
errJeon, Jun Woo; Joo, Ki-Nam
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errSave
Direct instantaneous 2-D imaging for photoacoustic waves by ultrashort single pulse interferometry
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2019-10-01
err5
PREAI
errLu, Yang; Kim, Daehee; Kim, Byunggi; Park, Jiyong; Yan, Liping; Yu, Liandong; Joo, Ki-Nam; Kim, Seung-Woo
errShare
errSave
Rigorous single pulse imaging for ultrafast interferometric observation
errOPTICS EXPRESS
IF3.3
err2019-07-01
err9
errOAAI
errKim, Daehee; Lu, Yang; Park, Jiyong; Kim, Byunggi; Yan, Liping; Yu, Liandong; Joo, Ki-Nam; Kim, Seung-Woo
errShare
errSave
Novel combined measurement system to characterize film structures by spectral interferometry and ellipsometry
errOPTICS EXPRESS
IF3.3
err2018-12-18
err9
errOAAI
errYun, Young Ho; Joo, Ki-Nam
errShare
errSave
SPARSE (spatially phase-retarded spectroscopic ellipsometry) for real-time film analysis
errOPTICS LETTERS
IF3.3
err2017-08-10
err19
PREAI
errKim, Dae Hee; Yun, Young Ho; Joo, Ki-Nam
errShare
errSave
Dual low coherence scanning interferometry for rapid large step height and thickness measurements
errOPTICS EXPRESS
IF3.3
err2016-12-02
err18
errOAAI
errPark, Hyo Mi; Jung, Hee Won; Joo, Ki-Nam
errShare
errSave

Research Directions

The data has not been retrieved yet.
Co-authors
Cooperation Journals
S
Seung‐Woo Kim
H-index: 58 · Papers: 727
Y
Yang Lü
H-index: 56 · Papers: 307
Y
Yunseok Kim
H-index: 49 · Papers: 317
S
S. J. Jang
H-index: 34 · Papers: 114
J
Jong-Kyu Park
H-index: 33 · Papers: 304
View more