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S. Tougaard

institut national des sciences appliquees de lyon - insa lyon

52H-index
304Paper Count
1.1WCitation Count
Published Papers 33
Publication Date
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Determination of the Primary Excitation Spectra in XPS and AES
errNANOMATERIALS
IF4.3
err2023-01-13
err7
errOAAI
errPauly, Nicolas; Yubero, Francisco; Tougaard, Sven
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Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
errAPPLIED SURFACE SCIENCE ADVANCES
IF8.7
err2021-09-01
err692
errOAAI
errFairley, Neal; Fernandez, Vincent; Richard-Plouet, Mireille; Guillot-Deudon, Catherine; Walton, John; Smith, Emily; Flahaut, Delphine; Greiner, Mark; Biesinger, Mark; Tougaard, Sven; Morgan, David; Baltrusaitis, Jonas
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Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements
errAPPLIED SURFACE SCIENCE
IF6.9
err2021-03-01
err42
errOAAI
errSpencer, B. F.; Maniyarasu, S.; Reed, B. P.; Cant, D. J. H.; Ahumada-Lazo, R.; Thomas, A. G.; Muryn, C. A.; Maschek, M.; Eriksson, S. K.; Wiell, T.; Lee, T-L; Tougaard, S.; Shard, A. G.; Flavell, W. R.
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Method to correct ambient pressure XPS for the distortion caused by the gas
errAPPLIED SURFACE SCIENCE
IF6.9
err2020-11-01
err11
errOAAI
errTougaard, Sven; Greiner, Mark
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Determining the Thickness and Completeness of the Shell of Polymer Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy (vol 123, pg 29765, 2019)
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2020-01-30
err0
errOAAI
errMuller, Anja; Heinrich, Thomas; Tougaard, Sven; Werner, Wolfgang S. M.; Hronek, Martin; Kunz, Valentin; Radnik, Jorg; Stockmann, Jorg M.; Hodoroaba, Vasile-Dan; Benemann, Sigrid; Nirmalananthan-Budau, Nithiya; Geissler, Daniel; Sparnacci, Katia; Unger, Wolfgang E. S.
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Determining the Thickness and Completeness of the Shell of Polymer Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy
errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2019-11-12
err26
errOAAI
errMueller, Anja; Heinrich, Thomas; Tougaard, Sven; Werner, Wolfgang S. M.; Hronek, Martin; Kunz, Valentin; Radnik, Joerg; Stockmann, Joerg M.; Hodoroaba, Vasile-Dan; Benemann, Sigrid; Nirmalananthan-Budau, Nithiya; Geissler, Daniel; Sparnacci, Katia; Unger, Wolfgang E. S.
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Impact of curing time on ageing and degradation of phenol-urea-formaldehyde binder
errPOLYMER DEGRADATION AND STABILITY
IF7.4
err2018-06-01
err20
errOAAI
errOkhrimenko, D., V; Thomsen, A. B.; Ceccato, M.; Johansson, D. B.; Lybye, D.; Bechgaard, K.; Tougaard, S.; Stipp, S. L. S.
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Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample
errAPPLIED SURFACE SCIENCE
IF6.9
err2018-02-01
err23
PREAI
errZborowski, C.; Renault, O.; Torres, A.; Yamashita, Y.; Grenet, G.; Tougaard, S.
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Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers
errAPPLIED SURFACE SCIENCE
IF6.9
err2017-04-01
err29
PREAI
errRisterucci, P.; Renault, O.; Zborowski, C.; Bertrand, D.; Torres, A.; Rueff, J. -P.; Ceolin, D.; Grenet, G.; Tougaard, S.
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Quantitative analysis of satellite structures in XPS spectra of gold and silver
errAPPLIED SURFACE SCIENCE
IF6.9
err2016-10-01
err34
PREAI
errPauly, N.; Yubero, F.; Tougaard, S.
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Band-Gap Widening at the Cu(In,Ga)(S,Se)2 Surface: A Novel Determination Approach Using Reflection Electron Energy Loss Spectroscopy
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2016-08-05
err10
errOAAI
errHauschild, Dirk; Handick, Evelyn; Goehl-Gusenleitner, Sina; Meyer, Frank; Schwab, Holger; Benkert, Andreas; Pohlner, Stevhan; Palm, Joerg; Tougaard, Sven; Heske, Clemens; Weinhardt, Lothar; Reinert, Friedrich
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Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range
errAPPLIED PHYSICS LETTERS
IF3.6
err2016-07-05
err15
errOAAI
errRenault, O.; Zborowski, C.; Risterucci, P.; Wiemann, C.; Grenet, G.; Schneider, C. M.; Tougaard, S.
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Determination of electronic properties of nanostructures using reflection electron energy loss spectroscopy: Nano-metalized polymer as case study
errAPPLIED SURFACE SCIENCE
IF6.9
err2016-07-01
err10
PREAI
errDeris, Jamileh; Hajati, Shaaker; Tougaard, Sven; Zaporojtchenko, Vladimir
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Effects of cation compositions on the electronic properties and optical dispersion of indium zinc tin oxide thin films by electron spectroscopy
errMATERIALS RESEARCH BULLETIN
IF5.7
err2015-02-01
err8
errOAAI
errDenny, Yus Rama; Seo, Soonjoo; Lee, Kangil; Oh, Suhk Kun; Kang, Hee Jae; Heo, Sung; Chung, Jae Gwan; Lee, Jae Cheol; Tougaard, Sven
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Probing deeper by hard x-ray photoelectron spectroscopy
errAPPLIED PHYSICS LETTERS
IF3.6
err2014-02-07
err31
errOAAI
errRisterucci, P.; Renault, O.; Martinez, E.; Detlefs, B.; Delaye, V.; Zegenhagen, J.; Gaumer, C.; Grenet, G.; Tougaard, S.
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Electronic and optical properties of Al2O3/SiO2 thin films grown on Si substrate
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2010-06-10
err82
PREAI
errTahir, Dahlang; Kwon, Hyuk Lan; Shin, Hye Chung; Oh, Suhk Kun; Kang, Hee Jae; Heo, Sung; Chung, Jae Gwan; Lee, Jae Cheol; Tougaard, Sven
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XPS for non-destructive depth profiling and 3D imaging of surface nanostructures
errANALYTICAL AND BIOANALYTICAL CHEMISTRY
IF3.8
err2010-01-21
err41
PREAI
errHajati, Shaaker; Tougaard, Sven
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First nucleation steps of nickel nanoparticle growth on Al2O3 (0001) studied by XPS inelastic peak shape analysis
errAPPLIED SURFACE SCIENCE
IF6.9
err2008-12-01
err4
PREAI
errGallardo-Vega, C.; De La Cruz, W.; Tougaard, S.; Cota-Araiza, L.
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Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms (vol 77, art no 155403, 2008)
errPHYSICAL REVIEW B
IF3.7
err2008-06-05
err2
errOAAI
errHajati, Shaaker; Romanyuk, Oleksandr; Zemek, Josef; Tougaard, Sven
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Test of validity of the V-type approach for electron trajectories in reflection electron energy loss spectroscopy
errPHYSICAL REVIEW B
IF3.7
err2008-06-04
err24
PREAI
errYubero, F.; Pauly, N.; Dubus, A.; Tougaard, S.
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Research Directions

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Co-authors
Cooperation Journals
D
David Morgan
H-index: 82 · Papers: 955
K
K. Bechgaard
H-index: 68 · Papers: 603
S
S. L. S. Stipp
H-index: 66 · Papers: 305
J
Jonas Baltrušaitis
H-index: 65 · Papers: 409
C
Claus M. Schneider
H-index: 63 · Papers: 714
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