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SaveA Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS
Lu, Fei; Ma, Rui; Dong, Zongyu; Wang, Li; Zhang, Chen; Wang, Chenkun; Chen, Qi; Wang, X. Shawn; Zhang, Feilong; Li, Cheng; Tang, He; Cheng, Yuhua; Wang, Albert
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