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P

P. Bolcato

mentor graphics inc

5H-index
14Paper Count
109Citation Count
Published Papers 3
Publication Date
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Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2025-03-01
err0
PREAI
errVan Brandt, Leopold; Bonnin, Michele; da Silva, Mauricio Banaszeski; Bolcato, Pascal; Wirth, Gilson I.; Flandre, Denis; Delvenne, Jean-Charles
errShare
errSave
Proper Initial Solution to Start Periodic Steady-State-Based Methods
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2019-03-01
err2
PREAI
errDe Luca, Giovanni; Bolcato, Pascal; Schilders, Wil H. A.
errShare
errSave
Fast and Accurate Time-Domain Simulations of Integer-N PLLs
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2017-04-01
err6
errOAAI
errDe Luca, Giovanni; Bolcato, Pascal; Larcheveque, Remi; Rommes, Joost; Schilders, Wil H. A.
errShare
errSave

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Co-authors
Cooperation Journals
D
Denis Flandre
H-index: 51 · Papers: 1.2K
J
Jean‐Charles Delvenne
H-index: 30 · Papers: 200
G
Gilson Wirth
H-index: 23 · Papers: 227
W
W.H.A. Schilders
H-index: 18 · Papers: 222
M
Michele Bonnin
H-index: 14 · Papers: 131
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