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Chengyuan Yao

tianjin university

7H-index
17Paper Count
274Citation Count
Published Papers 6
Publication Date
Real-time spectral signal processing for robust thickness monitoring during wafer thinning
err2026-09-18
err0
PREAI
errZizheng Wang; Xinlei Sun; Hao Liu; Zhaoran Liu; TongTao Li; Haotian Dong; Chengyuan Yao; Chunguang Hu
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Deep learning for post-processing ensemble weather forecasts
err2021-02-15
err105
errOAAI
errGronquist, Peter; Yao, Chengyuan; Ben-Nun, Tal; Dryden, Nikoli; Dueben, Peter; Li, Shigang; Hoefler, Torsten
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Measuring the multilayer silicon based microstructure using differential reflectance spectroscopy
err2021-01-19
err11
errOAAI
errHuo, Shuchun; Wang, Hao; Hu, Chunguang; Yao, Chengyuan; Shen, Wanfu; Hu, Xiaodong; Hu, Xiaotang
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