logo
CanyamAI summaries for academic research
language
MobileMobile
  • Phone FeatureWeChat Mini Program
EnglishEnglish
noticeNotice
BlogBlog
delete
arrow
Back
C

Chien‐Tai Lin

tamkang university

22H-index
90Paper Count
1.4KCitation Count
Published Papers 11
Publication Date
logo
Exact Inference and Prediction for Exponential Models Under General Progressive Censoring with Application to Tire Wear Data
errMATHEMATICS
IF2.2
err2025-11-12
err0
errOAAI
errLin, Chien-Tai
errShare
errSave
Optimal progressively censored reliability sampling plans for log-location-scale distributions
errQUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
IF3
err2025-11-01
err0
PREAI
errLin, Chien-Tai; Jian, Shao-Lun; Balakrishnan, N.
errShare
errSave
Lamination Scheme of Curing Degree at Multiple Levels of Temperature With Location-Scale Regression
errIEEE ACCESS
IF3.6
err2021-01-01
err1
errOAAI
errTsai, Chih-Chun; Lin, Chien-Tai; Balakrishnan, Narayanaswamy
errShare
errSave
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2015-12-01
err10
PREAI
errTsai, Chih-Chun; Lin, Chien-Tai
errShare
errSave
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2015-06-01
err21
PREAI
errTsai, Chih-Chun; Lin, Chien-Tai; Balakrishnan, Narayanaswamy
errShare
errSave
Statistical Inference for a Lognormal Step-Stress Model With Type-I Censoring
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2012-06-01
err10
PREAI
errLin, Chien-Tai; Chou, Cheng-Chieh
errShare
errSave
A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2008-12-01
err43
PREAI
errLin, Chien-Tai; Huang, Yen-Lung; Balakrishnan, N.
errShare
errSave
A comparison of two simple prediction intervals for exponential distribution (vol 54, pg 27, 2005)
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2005-06-01
err0
PREAI
errBalakrishnan, N; Lin, CT; Chan, PS
errShare
errSave
A comparison of two simple prediction intervals for exponential distribution
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2005-03-01
err9
PREAI
errBalakrishnan, N; Lin, CT; Chan, PS
errShare
errSave
Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2003-03-01
err107
PREAI
errBalakrishnan, N; Kannan, N; Lin, CT; Ng, HKT
errShare
errSave
The properties of SiO2 films using direct photo-chemical vapor deposition on strained SiGe layers
errAPPLIED SURFACE SCIENCE
IF6.9
err1996-02-01
err2
PREAI
errLin, CT; Chang, SJ; Nayak, DK; Shiraki, Y
errShare
errSave

Research Directions

The data has not been retrieved yet.
Co-authors
Cooperation Journals
N
N. Balakrishnan
H-index: 82 · Papers: 1.5K
H
Hon Keung Tony Ng
H-index: 35 · Papers: 280
S
Sue-Joan Chang
H-index: 30 · Papers: 121
N
N. Balakrishnan
H-index: 22 · Papers: 215
P
Ping Shing Chan
H-index: 19 · Papers: 66
View more