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Richard Beanland

University of Warwick

41H-index
323Paper Count
7.2KCitation Count
Published Papers 101
Publication Date
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IF12.1
err2026-07-28
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errOAAI
errDaniel Houghton; Yisong Han; Richard Beanland; Louis Godeffroy; Frédéric Kanoufi; Viacheslav Shkirskiy; Jonathan Sharman; Julie V. Macpherson
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errSmall
IF12.1
err2026-05-20
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errOAAI
errPei Zhao; Daniel Houghton; Richard Beanland; Julie V. Macpherson
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errActa Materialia
IF9.3
err2026-04-29
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PREAI
errCeline M. King; Robin Sjökvist; Mark S. Senn; Jeremiah P. Tidey; Richard Beanland; Rik Drummond-Brydson; Andy P. Brown
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errJournal of Applied Physics
IF2.5
err2026-04-28
err0
PREAI
errTrevisan, Aurelia; Verstijnen, Tom J. F.; Alvarado-Cesar, Francisco; Carro, Alejandro Gallego; Ulloa, Jose M.; Beanland, Richard; Koenraad, Paul M.
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errAdvanced Electronic Materials
IF5.3
err2026-02-09
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errOAAI
errEoin Moynihan; Yining Xie; David Cooper; Grigore Moldovan; Richard Beanland; Ana Sanchez
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errAdvanced Materials
IF26.8
err2026-01-21
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errOAAI
errWei Peng; Aditya Singh; M. Haroon Qaiser; Philipp Fahler-Muenzer; Freya Watson; Liang Si; Yining Xie; Katarzyna E. Sopińska; Daniel A. Chaney; Ana M. Sanchez; T. Ben Britton; Richard Beanland; Marios Hadjimichael; Marin Alexe
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errInternational Materials Reviews
IF15.5
err2025-12-23
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PREAI
errIan M. Reaney; Richard Beanland; Robin Sjökvist; Yubo Zhu; Ge Wang; Derek C. Sinclair
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errACS Nano
IF16
err2025-12-03
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errOAAI
errPei Zhao; Daniel Houghton; Joshua J. Tully; Dimitrios Valavanis; Patrick R. Unwin; Richard Beanland; Yisong Han; Marc Walker; Mark E. Newton; Julie V. Macpherson
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errADVANCED FUNCTIONAL MATERIALS
IF19
err2025-11-01
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errZeiger, Caren R.; Dragland, Ruben S.; Sjokvist, Robin; Beanland, Richard; Meier, Dennis; Grande, Tor; Senn, Mark S.; Grendal, Ola G.
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errJournal of Physics D: Applied Physics
IF3.2
err2025-09-30
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PREAI
errMakhayeni Mtunzi; Haotian Zeng; Lifeng Bao; Chong Chen; Jae-Seong Park; Huiwen Deng; Yangqian Wang; Hui Jia; Jun Li; Hexing Wang; Yaonan Hou; Mateus G Masteghin; Richard Beanland; Frederic Gardes; Jeremy Moeyaert; Thierry Baron; Mingchu Tang; Alwyn Seeds; Huiyun Liu
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errJOURNAL OF APPLIED PHYSICS
IF2.5
err2025-09-07
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errOAAI
errKumar, Abhishek; Dar, Musaibh Farooq; Hodgson, Peter D.; Lane, Dominic; Carrington, Peter J.; Delli, Evangelia; Beanland, Richard; Mehrotra, Shruti; Hayne, Manus; Dasgupta, Avirup
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errCommunications Materials
IF9.6
err2025-07-23
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errOAAI
errPavel Marton; Marek Paściak; Mauro A. P. Gonçalves; Ondřej Novák; Jiří Hlinka; Richard Beanland; Marin Alexe
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errACS APPLIED NANO MATERIALS
IF5.5
err2025-05-16
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errOAAI
errZhang, JP; Thomas, S; Mustafa, ANM; Greenacre, V; Zhelev, N; Ali, SR; Han, YS; Song, SK; Zhang, HW; Graham, A; Abdelazim, NM; Ramadan, S; Beanland, R; Reid, G; Bartlett, PN; de Groot, K; Noori, YJ
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errSOLAR ENERGY MATERIALS AND SOLAR CELLS
IF6.3
err2025-04-01
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errPain, Sophie L.; Wilkins, Luke; Yadav, Anup; Han, Yisong; Beanland, Richard; Grant, Nicholas E.; Murphy, John D.
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errAPL PHOTONICS
IF5.3
err2025-01-08
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errBrown, Richard; Liu, Chen; Seager, George; Alvarado, Francisco; Wong, Ka Ming; Craig, Adam P.; Beanland, Richard; Marshall, Andrew R. J.; Davies, J. Iwan; Li, Qiang
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errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2024-12-06
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PREAI
errFonseka, H. A.; Denis, N.; Gott, J. A.; Yuan, X.; Beanland, R.; Tan, H. H.; Jagadish, C.; Sanchez, A. M.; De Luca, M.
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errJOURNAL OF PHYSICAL CHEMISTRY C
IF3.2
err2024-10-22
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errBlack, Alexander W.; Abdelazim, Nema M.; Noori, Yasir J.; Han, Yisong; Zhelev, Nikolay; Thomas, Shibin; Zhang, Wenjian; Reid, Gillian; Beanland, Richard; de Groot, C. H. Kees; Bartlett, Philip N.
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errSCIENTIFIC REPORTS
IF3.9
err2024-06-18
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errOAAI
errKapur, Omesh; Guo, Dongkai; Reynolds, Jamie; Newbrook, Daniel; Han, Yisong; Beanland, Richard; Jiang, Liudi; de Groot, C. H. Kees; Huang, Ruomeng
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errMATERIALS
IF3.2
err2024-05-11
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errNasir, Tauqir; Han, Yisong; Blackman, Chris; Beanland, Richard; Hector, Andrew L.
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errCOMMUNICATIONS MATERIALS
IF9.6
err2024-05-07
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errOAAI
errTidey, Jeremiah P.; Dey, Urmimala; Sanchez, Ana M.; Chen, Wei-Tin; Chen, Bo-Hao; Chuang, Yu-Chun; Fernandez-Diaz, Maria T.; Bristowe, Nicholas C.; Beanland, Richard; Senn, Mark S.
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Research Directions

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