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Stmicroelectronics

学者数1.3K
论文数793
被引数2
关联论文 (787)
发表时间
Fully integrated quantum frequency processor on a silicon chip硅芯片上的全集成量子频率处理器
err2026-09-15
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errSara Congia; Leopold Virot; Elena Rovetta; Antonio Fincato; Frederic Boeuf; Matteo Galli; Daniele Bajoni; Massimo Borghi
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High-Detectivity InGaAs/GaAsP Superlattice PIN Photodetector with a Thin Absorber on GaAs substrate for 1100 nm Applications高探测度InGaAs/GaAsP超晶格PIN光电探测器:用于1100 nm应用的薄吸收层GaAs衬底器件
err2026-09-13
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errRémy Tribout; Alexis Palais; Driss Mouloua; Mickael Martin; Frédérique Ducroquet; Sébastien Cavalaglio; Badreddine Smiri; Jeremy Da Fonseca; Jeremy Moeyaert; Clara Cornille; Franck Bassani; Charles Leroux; Veronika Letka; Vita Mergner; David Cooper; Evan Oudot; Christophe Duluard; Sophie Barbet; Christophe Jany; Thierry Baron
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Transient Thermal Dynamics of Power SiC MOSFETs功率SiC MOSFETs的瞬态热动力学
err2026-09-02
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errCorina-Ruxandra Mitulescu (Sandulescu); Mihai Branzei; Mircea Lapau; Geanina Mihai; Angelo Alberto Messina; Marius Enachescu
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Cross-platform deployment and characterization of an on-device generative conversational agent跨平台部署与在设备上生成式对话代理的表征
err2026-09-02
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errPietro Firpo; Riccardo Berta; Francesco Bellotti; Luca Lazzaroni; Matteo Fresta; Alessandro Pighetti; Aydin Abedinia; Niloofar Yoonesi; Danilo Pietro Pau
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The Suitability of a Remote Microwave Radiometer for Detecting Volcanic Activity远程微波辐射计探测火山活动的适用性
err2026-08-28
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errAlessandro Bonforte; Rosario Catania; Salvatore Roberto Maugeri; Salvatore Caffo; Flavio Falcinelli
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A Variation-Tolerant 1.25-MHz Multi-Resonant GaN Switched-Capacitor DC/DC Converter容错型1.25-MHz多谐振GaN开关电容DC/DC转换器
err2026-08-18
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errMarco Guerrini; Alessio Antolini; Alessandro Nicolosi; Sandro Rossi; Eleonora Franchi Scarselli; Aldo Romani
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Efficient sEMG decoding with hybrid, multi-timescale neural networks基于混合多时间尺度神经网络的sEMG高效解码
err2026-08-13
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errAndrea Ortone; Maxime Fabre; Riccardo Massa; Alberto Mazzoni; Giuseppe Desoli; Calogero Maria Oddo; Emre Neftci
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Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218修正:Amato等人。利用半导体生产中通过SEM检测到的缺陷来检测重要特征和预测产量。传感器 2025, 25, 4218
errSensors
IF3.5
err2026-08-13
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errUmberto Amato; Anestis Antoniadis; Italia De Feis; Anastasiia Doinychko; Irène Gijbels; Antonino La Magna; Daniele Pagano; Francesco Piccinini; Easter Selvan Suviseshamuthu; Carlo Severgnini; Andres Torres; Patrizia Vasquez
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Coupled-Lines Modeling and Design in (Bi)CMOS Technologies在(Bi)CMOS技术中的耦合线建模与设计
err2026-07-16
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errJoão E. Gentil Lé; Jean-Daniel Arnould; Ariana L. C. Serrano; Gustavo P. Rehder; Cédric Durand; Loïc Vincent; Philippe Ferrari
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ArF grayscale lithography for high-volume manufacturing of submicron 3D structuresArF灰度光刻技术用于大规模制造亚微米级3D结构
err2026-06-29
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errGaby BÉLOT; Sébastien BÉRARD-BERGERY; Élodie SUNGAUER; Aurélien FAY; Api WARSONO; Arnaud BAZIN; Cécile GOURGON
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