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Z
Zygo Corporation
学者数
14
论文数
10
被引数
0
关联论文
(10)
发表时间
发表时间
IF
被引数
Comparison of theory with the experimental characterization of the spatial frequency response of interferometers using a binary pseudo-random array sample
理论与干涉仪空间频率响应实验表征的对比研究:基于二元伪随机阵列样本
Optical Engineering
IF
1.2
2026-03-01
0
PRE
AI
de Groot, Peter J.; Colonna de Lega, Xavier; Munechika, Keiko; Lacey, Ian; Rochester, Simon; Smith, Nicolas D.; Takacs, Peter; Yamada, Kaito; Yashchuk, Valeriy V.
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Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
OPTICA
IF
8.5
2023-01-25
9
OA
AI
Alcock, Simon G.; NIsTEA, Ioana-theodora; Badami, Vivek G.; Signorato, Riccardo; FusCO, Matteo; Hu, Lingfei; Wang, Hongchang; Sawhney, Kawal
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International comparison of flatness deviation in areal surface topography measurements
CIRP ANNALS-MANUFACTURING TECHNOLOGY
IF
3.6
2022-01-01
3
OA
AI
Vanrusselt, Maxim; Haitjema, Han; Leach, Richard; de Groot, Peter
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Surface measuring coherence scanning interferometry beyond the specular reflection limit
OPTICS EXPRESS
IF
3.3
2021-10-19
17
OA
AI
Thomas, Matthew; Su, Rong; de Groot, Peter; Coupland, Jeremy; Leach, Richard
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Characterization of Core Optics in Gravitational-Wave Detectors: Case Study of KAGRA Sapphire Mirrors
PHYSICAL REVIEW APPLIED
IF
4.4
2020-07-08
13
OA
AI
Hirose, Eiichi; Billingsley, GariLynn; Zhang, Liyuan; Yamamoto, Hiroaki; Pinard, Laurent; Michel, Christoph; Forest, Daniele; Reichman, Bill; Gross, Mark
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A review of selected topics in interferometric optical metrology
干涉光学计量中选定主题的回顾
REPORTS ON PROGRESS IN PHYSICS
IF
20.7
2019-04-23
62
PRE
AI
de Groot, Peter J.
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Defect propagation in NiTi rotary instruments: a noncontact optical profilometry analysis
INTERNATIONAL ENDODONTIC JOURNAL
IF
7.1
2018-05-04
5
PRE
AI
Barbosa, I.; Ferreira, F.; Scelza, P.; Neff, J.; Russano, D.; Montagnana, M.; Zaccaro Scelza, M.
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A new method for the assessment of the surface topography of NiTi rotary instruments
INTERNATIONAL ENDODONTIC JOURNAL
IF
7.1
2016-10-28
16
PRE
AI
Ferreira, F.; Barbosa, I.; Scelza, P.; Russano, D.; Neff, J.; Montagnana, M.; Zaccaro Scelza, M.
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Precision engineering for astronomy and gravity science
CIRP ANNALS-MANUFACTURING TECHNOLOGY
IF
3.6
2010-01-01
85
PRE
AI
Shore, P.; Cunningham, C.; DeBra, D.; Evans, C.; Hough, J.; Gilmozzi, R.; Kunzmann, H.; Morantz, P.; Tonnellier, X.
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Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling
OPTICS EXPRESS
IF
3.3
2008-03-10
26
OA
AI
de Groot, Peter; de Lega, Xavier Colonna; Liesener, Jan; Darwin, Michael
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