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Zygo Corporation

学者数14
论文数10
被引数0
关联论文 (10)
发表时间
Comparison of theory with the experimental characterization of the spatial frequency response of interferometers using a binary pseudo-random array sample理论与干涉仪空间频率响应实验表征的对比研究:基于二元伪随机阵列样本
err2026-03-01
err0
PREAI
errde Groot, Peter J.; Colonna de Lega, Xavier; Munechika, Keiko; Lacey, Ian; Rochester, Simon; Smith, Nicolas D.; Takacs, Peter; Yamada, Kaito; Yashchuk, Valeriy V.
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Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
errOPTICA
IF8.5
err2023-01-25
err9
errOAAI
errAlcock, Simon G.; NIsTEA, Ioana-theodora; Badami, Vivek G.; Signorato, Riccardo; FusCO, Matteo; Hu, Lingfei; Wang, Hongchang; Sawhney, Kawal
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International comparison of flatness deviation in areal surface topography measurements
err2022-01-01
err3
errOAAI
errVanrusselt, Maxim; Haitjema, Han; Leach, Richard; de Groot, Peter
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Surface measuring coherence scanning interferometry beyond the specular reflection limit
err2021-10-19
err17
errOAAI
errThomas, Matthew; Su, Rong; de Groot, Peter; Coupland, Jeremy; Leach, Richard
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Characterization of Core Optics in Gravitational-Wave Detectors: Case Study of KAGRA Sapphire Mirrors
err2020-07-08
err13
errOAAI
errHirose, Eiichi; Billingsley, GariLynn; Zhang, Liyuan; Yamamoto, Hiroaki; Pinard, Laurent; Michel, Christoph; Forest, Daniele; Reichman, Bill; Gross, Mark
err分享
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Defect propagation in NiTi rotary instruments: a noncontact optical profilometry analysis
err2018-05-04
err5
PREAI
errBarbosa, I.; Ferreira, F.; Scelza, P.; Neff, J.; Russano, D.; Montagnana, M.; Zaccaro Scelza, M.
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err收藏
A new method for the assessment of the surface topography of NiTi rotary instruments
err2016-10-28
err16
PREAI
errFerreira, F.; Barbosa, I.; Scelza, P.; Russano, D.; Neff, J.; Montagnana, M.; Zaccaro Scelza, M.
err分享
err收藏
Precision engineering for astronomy and gravity science
err2010-01-01
err85
PREAI
errShore, P.; Cunningham, C.; DeBra, D.; Evans, C.; Hough, J.; Gilmozzi, R.; Kunzmann, H.; Morantz, P.; Tonnellier, X.
err分享
err收藏
Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling
err2008-03-10
err26
errOAAI
errde Groot, Peter; de Lega, Xavier Colonna; Liesener, Jan; Darwin, Michael
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