Jeol Ltd

学者数37

论文数16

被引数0

关联论文 (12)

发表时间

Ultrathin ZSM-5 zeolite nanocrystals synthesized from purely inorganic precursors 由纯无机前驱体制备的超薄ZSM-5沸石纳米晶体

Chinese Journal of Catalysis

IF17.7

2026-09-24

PREAI

Jiaqi Zhao; Peiyu Shen; Zhengxing Qin; Camille Longue; Nourrdine Chaouati; Ruizhe Zhang; Xiao Chen; Shunsuke Asahin; Natsuko Asano; Gabriel Rueff; Eddy Dib; Hongman Sun; Libin Kang; Jiujiang Wang; Hongjuan Zhao; Honghai Liu; Shutao Xu; Ludovic Pinard; Zifeng Yan; Svetlana Mintova

Development of the 300 kV Magnetic Field-Free Atomic Resolution Electron Microscope 300 kV无磁场原子分辨率电子显微镜的开发

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Yuji Kohno; Tatsuhiro Maekawa; Shigeyuki Morishita; Hidetaka Sawada; Isamu Ishikawa; Naoya Shibata

Next-Generation Atomic-Resolution Spectroscopy and Multidimensional Imaging with the Monochromated JEOL ARMD-TEM 下一代原子级分辨率光谱和多维成像技术与单色化JEOL ARMD-TEM

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Tobias Heil; Heiko Müller; Stephan Uhlemann; Pirmin Kükelhan; Martin Linck; Hongguang Wang; Akiho Nakamura; Masaki Mukai; Peter A van Aken

Crystal Orientation Estimation Using Discrete Fourier Transform Analysis of Backscattered Electron Azimuthal Distributions 利用背散射电子方位分布的离散傅里叶变换分析进行晶体取向估计

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Takeshi Otsuka; Seiichi Takami

Critical Dimension Measurement of ONON Layer Thickness Using OBF STEM: Low-Dose, High-Contrast Imaging 使用OBF STEM的低剂量、高对比度成像测量ONON层厚度：关键尺寸

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Masayasu Yoneda; Masahide Shima; Kyoichiro Asayama; Shuji Kawai; Segawa Yuhiro; Kazuya Yamazaki; Kevin Mcilwrath

Automatic Aberration Correction Using 4D-STEM: Development and Demonstration 基于4D-STEM的自动像差校正：开发与演示

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Konosuke Oe; Koudai Tabata; Takehito Seki; Yuji Kohno; Naoya Shibata

Development and Applications of a High-Speed Spectrum Imaging Method in Auger Electron Spectroscopy 开发和应用一种在俄歇电子能谱中的高速光谱成像方法

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Fuyuki Nabeshima; Konomi Ikita; Tatsuya Uchida; Noboru Taguchi; Kazushiro Yokouchi; Akihiro Tanaka; Toshiyuki Ohama; Kenichi Tsutsumi

New Opportunities with the Advent of Monochromated Magnetic-field-free Atomic-resolution Scanning Transmission Electron Microscopy 单色磁场自由原子分辨率扫描透射电子显微镜的出现带来的新机遇

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Jaeyeon Jo; Yohei Tomizawa; James Schultz; Keith Koontz; Tatsuhiro Maekawa; Robert F Klie

Micro-area Analysis Method for Lithium-ion Battery Reaction Products Using SEM with VUV Spectroscopy and VCA Phase Analysis by EDS 采用VUV光谱学和EDS VCA相分析的SEM锂离子电池反应产物微区分析方法

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Yasuaki Yamamoto; Takanori Murano; Shogo Koshiya; Kentaro Kato; Mayu Morimoto; Yasuhito Aoki

Comparison of Analytical Sensitivities of Simultaneously Acquired EELS and XEDS Signals from Same Ionization Processes 同时获取的EELS和XEDS信号来自相同电离过程的解析灵敏度比较

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Masashi Watanabe; Alexander Campos-Quiros; Giulio Guzzinati; Pirmin Kükelhan; Volker Gerheim; Martin Linck; Heiko Müller; Max Haider; Thomas F Hoffman; Kotaro Sakaguchi; Masaki Mukai; Takeshi Kaneko; Naoki Shimura; Shintaro Hirata; Akiho Nakamura; Masashi Nishikawa; Thomas Isabell; Hidetaka Sawada

Developments of a Large-Convergence-Angle Scanning Transmission Electron Microscope Operable Over a Wide Range of Accelerating Voltages 大收敛角扫描透射电子显微镜的发展：适用于宽范围加速电压操作

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Gen Koinuma; Yuki Ninota; Philipp Wachsmuth; Naoya Chihara; Yu Jimbo; Svenja Perl; Thomas Riedel; Stephan Uhlemann

Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography 特刊：常规（扫描）电子显微镜和电子断层扫描中的定量与精确测量

Micron

IF2.2

2026-07-01

PREAI

Malac, Marek; Harada, Ken; Yaguchi, Toshie; Taniguchi, Yoshifumi; Yamasaki, Jun; Howe, Jane; Blackburn, Arthur; Motoki, Sohei; Konyuba, Yuji