Gatan Inc

学者数36

论文数13

被引数0

关联论文 (12)

发表时间

Fast HR-EBSD Based Pattern Center Calibration 基于快速高分辨率电子背散射衍射的图像中心校准

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

William C Lenthe; Stuart I Wright; Matthew M Nowell; Rene de Kloe

New Scan Strategies for Spectrum Image Acquisition of Dose-Constrained Materials.剂量受限材料光谱图像采集的新扫描策略。

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Andrew Thron; Liam Spillane; Paul Thomas; Bernhard Schaffer; Ray Twesten

Improving the Accessibility and Performance of Deformation, Defect, and Strain Analysis with Electron Backscatter Diffraction (EBSD)利用电子背散射衍射（EBSD）提高形变、缺陷和应变分析的可达性与性能

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Matthew M Nowell; William C Lenthe; Stuart I Wright; Rene de Kloe

Enhanced Multimodal Workflow Capabilities with EELS and Precession-Assisted 4D STEM 结合EELS和预cession辅助4D STEM的增强型多模态工作流程能力

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Fernando C Castro; Andrew Thron; Liam Spillane

Multimodal STEM Analysis of Semiconductor Devices at Low kV: Dose-Efficient Wide-Range EELS and 4D STEM at Extended Camera Length 低kV下半导体器件的多模态STEM分析：高剂量效率宽范围EELS和长相机长度4D STEM

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Liam Spillane; Andrew Thron; Fernando Castro; Ray D Twesten

Local Glass Composition and Microstructure Mitigate PID Failure in Silicon Solar Cells: A Multimodal In-Situ Biasing Study 局部玻璃组成和微观结构缓解硅太阳能电池的PID失效：一种多模态原位偏置研究

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Steven C Hayden; Caleb Okrucky; Andrew Thron; John Mangum; Ashley Gaulding; Patrick Walker; Katherine Jungjohann

Micro-XRF Characterization of SEM Coatings Deposited by a Broad Argon Ion Beam Tool 宽氩离子束工具沉积的SEM涂层的微X射线荧光表征

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Shangshang Mu; Gerward Weppelman; Cecilia Xu; Steve Coyle; Chris Booth

SEM Study of Lithium-Containing Microstructures for Battery and Biomedical Technologies 扫描电镜研究锂基微结构在电池和生物医学技术中的应用

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Shangshang Mu; Julia Mausz; David Stowe

From Low-dose to High-kV: a Large Area Windowless SEM–EDS Approach for Real-world Materials Analysis 从低剂量到高kV：一种大区域无窗SEM–EDS方法用于实际材料分析

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

David Stowe; Julia Mausz; Sophie Yan; Jens Rafaelsen

Closing the Feedback Loop: Live Polarization Analysis for Automated In Situ 4D-STEM and SEM 闭合反馈环路：用于自动化原位4D-STEM和SEM的实时极化分析

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Fintan Hardy; Noah Schnitzer; Mariana Palos; Liam Spillane; Aron Walsh; Michele Conroy

High-Precision Micro-XRF for Forensic Glass Comparison: A Study of Cross-Generation Consistency and Efficiency 高精度微-XRF在法医玻璃比对中的应用：一项关于跨代一致性和效率的研究

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Shangshang Mu; Gerward Weppelman; Aurélien Moy; Steve Coyle; Ed James; Jacob Wilbrink; Chris Booth

Optimized Electrostatic Beam Blanking for Dose-Controlled Liquid Phase In-Situ STEM: Imaging, EELS, and 4D-STEM of Au Nanoparticle Growth Dynamics 优化静电束消隐用于剂量控制的液相原位STEM：成像、EELS和4D-STEM对Au纳米粒子生长动态的研究

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Liam Spillane; Mervan Ramadan; Cheng Sun; Marc-Georg Willinger