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Ametek Bv Edax

学者数3
论文数2
被引数0
关联论文 (2)
发表时间
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Fast HR-EBSD Based Pattern Center Calibration基于快速高分辨率电子背散射衍射的图像中心校准
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errWilliam C Lenthe; Stuart I Wright; Matthew M Nowell; Rene de Kloe
err分享
err收藏
Improving the Accessibility and Performance of Deformation, Defect, and Strain Analysis with Electron Backscatter Diffraction (EBSD)利用电子背散射衍射（EBSD）提高形变、缺陷和应变分析的可达性与性能
errMicroscopy and Microanalysis
IF3
err2026-07-27
err0
errOAAI
errMatthew M Nowell; William C Lenthe; Stuart I Wright; Rene de Kloe
err分享
err收藏