Oxford Instruments

学者数13

论文数6

被引数0

关联论文 (6)

发表时间

Impact of post-deposition annealing on the interface and electrical properties of ALD-deposited SiO2 and HfO2/SiO2 gate stacks on 4H-SiC MOS devices 后沉积退火对4H-SiC MOS器件上原子层沉积SiO2和HfO2/SiO2栅极堆栈界面及电学性质的影响

Materials Science in Semiconductor Processing

IF4.6

2026-04-27

OAAI

Mustafa Akif Yildirim; Vishal Ajit Shah; Oliver Vavasour; Xinkai Tian; Andrew Newton; Michael J. Powell; Sami Bolat; Richard Jefferies; David Walker; Marina Antoniou; Peter M. Gammon; Arne Benjamin Renz

Lab-on-a-Chip Metabolic Analysis Using Benchtop NMR Technology

Analytical Chemistry

IF6.7

2026-01-19

OAAI

Marc Azagra; Hetal Patel; Alejandro Portela; Dian Weerakonda; Behdad Aghelnejad; Jose Yeste; Gergő Matajsz; Marc Dubois; Matthew Fallon; Tryfon Antonakakis; Javier Ramón-Azcón; Irene Marco-Rius

Phase Transformation Mechanisms and Plastic Deformation in Shocked High-Pressure Minerals Using Near-Axis TKD and 4D-STEM

Microscopy and Microanalysis

IF3

2025-07-25