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P
Patrick Egan
national institute of standards & technology (nist) - usa
11
H指数
55
论文数
733
被引数
0
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9
发表时间
发表时间
IF
被引数
A prospectus on direct traceability to the kelvin for point-of-use applications
关于点用应用中对开尔文直接溯源的展望
Philosophical Transactions of the Royal Society A-Mathematical Physical and Engineering Sciences
IF
3.7
2026-01-15
1
PRE
AI
Tew, Weston; Egan, Patrick; Gillis, Keith
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Capability of commercial trackers as compensators for the absolute refractive index of air
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
IF
3.7
2022-09-01
5
PRE
AI
Egan, Patrick F.
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Cell-based refractometer for pascal realization
OPTICS LETTERS
IF
3.3
2017-07-24
30
OA
AI
Egan, Patrick F.; Stone, Jack A.; Ricker, Jacob E.; Hendricks, Jay H.; Strouse, Gregory F.
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Performance of a dual Fabry-Perot cavity refractometer
OPTICS LETTERS
IF
3.3
2015-08-18
59
PRE
AI
Egan, Patrick F.; Stone, Jack A.; Hendricks, Jay H.; Ricker, Jacob E.; Scace, Gregory E.; Strouse, Gregory F.
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Weak-value thermostat with 0.2 mK precision
OPTICS LETTERS
IF
3.3
2012-11-30
76
PRE
AI
Egan, Patrick; Stone, Jack A.
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Application of a logarithmic complementary metal-oxide-semiconductor camera in white-light interferometry
对数互补金属氧化物半导体相机在白光干涉测量中的应用
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF
5.9
2008-01-01
2
OA
AI
Egan, Patrick; Lakestani, Fereydoun; Whelan, Maurice P.; Connelly, Michael J.
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Small punch test: An approach to solve the inverse problem by deformation shape and finite element optimization
COMPUTATIONAL MATERIALS SCIENCE
IF
3.3
2007-07-01
53
PRE
AI
Egan, Patrick; Whelan, Maurice P.; Lakestani, Fereydoun; Connelly, Michael J.
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Random depth access full-field low-coherence interferometry applied to a small punch test
OPTICS AND LASERS IN ENGINEERING
IF
3.7
2007-04-01
4
PRE
AI
Egan, Patrick; Whelan, Maurice P.; Lakestani, Fereydoun; Connelly, Michael J.
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Random depth access full-field heterodyne low-coherence interferometry utilizing acoustooptic modulation and a complementary metal-oxide semiconductor camera
OPTICS LETTERS
IF
3.3
2006-04-01
13
OA
AI
Egan, P; Connelly, MJ; Lakestani, F; Maurice, P
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研究方向
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合作学者
合作期刊
M
Maurice Whelan
H 指数: 43 · 论文数: 221
J
Jay H. Hendricks
H 指数: 30 · 论文数: 106
K
Keith A. Gillis
H 指数: 22 · 论文数: 122
W
Weston L. Tew
H 指数: 22 · 论文数: 119
M
Michael J. Connelly
H 指数: 20 · 论文数: 185
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