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J

Jean-Pierre Teyssier

Keysight Technologies

18H指数
116论文数
1.2K被引数
收录论文 5
发表时间
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From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing
errIEEE MICROWAVE MAGAZINE
IF2.6
err2025-04-01
err1
PREAI
errTeyssier, Jp; Dunsmore, Joel; Singh, Suren; Messaoudi, Nizar; Kusano, Sam; Ericsson, Johan
err分享
err收藏
The Evolution of Vector Network Analyzers to Provide Precision Vector Spectrum Analysis for 6G Applications
errIEEE MICROWAVE MAGAZINE
IF2.6
err2024-12-01
err1
PREAI
errDunsmore, Joel P.; Teyssier, Jean-Pierre
err分享
err收藏
Spring ARFTG 2018 Microwave Measurement Conference
errIEEE MICROWAVE MAGAZINE
IF2.6
err2018-05-01
err0
errOAAI
errSchreurs, Dominique; Rumiantsev, Andrej; Teyssier, Jean-Pierre
err分享
err收藏
ARFTG June 2012
errIEEE MICROWAVE MAGAZINE
IF2.6
err2012-05-01
err0
PREAI
errSchreurs, Dominique; Teyssier, Jean-Pierre; Ridler, Nick; Sayed, Mohamed
err分享
err收藏
Introduction to measurements for power transistor characterization
errIEEE MICROWAVE MAGAZINE
IF2.6
err2008-06-01
err25
PREAI
errDe Groote, Fabien; Teyssier, Jean-Pierre; Gasseling, Tony; Jardel, Olivier; Verspecht, Jan
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
D
Dominique Schreurs
H 指数: 50 · 论文数: 1.0K
N
Nick Ridler
H 指数: 25 · 论文数: 237
O
Olivier Jardel
H 指数: 17 · 论文数: 95
M
Mohamed Sayed
H 指数: 15 · 论文数: 123
J
Joel P. Dunsmore
H 指数: 14 · 论文数: 97
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