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Amir Sajjad Bahman

aalborg university

22H指数
82论文数
1.9K被引数
收录论文 17
发表时间
Application-Oriented Characterization and Analysis of Core Materials Under Medium-Frequency Condition
err2023-09-01
err9
PREAI
errYang, Ming; Yang, Qingxin; Li, Yongjian; Lin, Zhiwei; Yue, Shuaichao; Wang, Huai; Bahman, Amir Sajjad
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Level-Set Interface Description Approach for Thermal Phase Change of Nanofluids
err2022-06-29
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errOAAI
errYahyaee, Ali; Bahman, Amir Sajjad; Olesen, Klaus; Sorensen, Henrik
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Improved Temperature Monitoring and Protection Method of Three-Level NPC Application Based on Half-Bridge IGBT Modules
err2022-01-01
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errOAAI
errWang, Qiang; Zhang, Jingwei; Iannuzzo, Francesco; Bahman, Amir Sajjad; Zhang, Weifeng; He, Fengyou
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Active Power Cycling Test Bench for SiC Power MOSFETs-Principles, Design, and Implementation
err2021-03-01
err35
errOAAI
errBaba, Sebastian; Gieraltowski, Andrzej; Jasinski, Marek; Blaabjerg, Frede; Bahman, Amir Sajjad; Zelechowski, Marcin
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An Extended Multilayer Thermal Model for Multichip IGBT Modules Considering Thermal Aging
err2021-01-01
err18
errOAAI
errAkbari, Mohsen; Bina, Mohammad Tavakoli; Bahman, Amir Sajjad; Eskandari, Bahman; Pouresmaeil, Edris; Blaabjerg, Frede
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Effect of Current Distortion and Unbalanced Loads on Semiconductors Reliability
err2021-01-01
err1
errOAAI
errLledo-Ponsati, Tomas; Bahman, Amir Sajjad; Iannuzzo, Francesco; Montesinos-Miracle, Daniel; Galceran-Arellano, Samuel
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A Review on IGBT Module Failure Modes and Lifetime Testing
err2021-01-01
err116
errOAAI
errAbuelnaga, Ahmed; Narimani, Mehdi; Bahman, Amir Sajjad
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Mission-Profile-Based Lifetime Prediction for a SiC MOSFET Power Module Using a Multi-Step Condition-Mapping Simulation Strategy
err2019-10-01
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errOAAI
errCeccarelli, Lorenzo; Kotecha, Ramchandra M.; Bahman, Amir Sajjad; Iannuzzo, Francesco; Mantooth, Homer Alan
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Frozen Leg Operation of a Three-Phase Dual Active Bridge Converter
err2019-05-01
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errOAAI
errHaghbin, Saeid; Blaabjerg, Frede; Bahman, Amir Sajjad
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Modeling of Short-Circuit-Related Thermal Stress in Aged IGBT Modules
err2017-09-01
err29
errOAAI
errBahman, Amir Sajjad; Iannuzzo, Francesco; Uhrenfeldt, Christian; Blaabjerg, Frede; Munk-Nielsen, Stig
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Complete Loss and Thermal Model of Power Semiconductors Including Device Rating Information
err2015-05-01
err161
errOAAI
errMa, Ke; Bahman, Amir Sajjad; Beczkowski, Szymon; Blaabjerg, Frede
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