András Vládar - Publications, H-index & Citations

András Vládar

university of colorado boulder

33H指数

276论文数

3.6K被引数

收录论文 11

发表时间

Using a 4-Megapixel Hybrid Photon Counting Detector for Fast, Laboratory-Based Nanoscale X-Ray Tomography 使用4兆像素混合光子计数探测器进行快速、基于实验室的纳米尺度X射线断层扫描技术

Microscopy and Microanalysis

IF3

2026-05-23

PREAI

Fonseca, Jordan; Levine, Zachary H.; Fowler, Joseph W.; Kim, Felix H.; O'Neil, Galen; Ortiz, Nathan J.; Scott, John Henry; Swetz, Daniel S.; Szypryt, Paul; Vladar, Andras E.; Nakamura, Nathan

Electron irradiation-based cleaning of the scanning electron microscope and its samples 基于电子辐照的扫描电子显微镜及其样品的清洁

Micron

IF2.2

2025-05-20

PREAI

András E. Vladár

Tuning Geometric Chirality in Metallic and Hybrid Nanostructures by Controlled Nanoscale Crystal Symmetry Breaking

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

IF15.6

2023-03-23

PREAI

Liu, Hanyu; Vladar, Andras E.; Wang, Peng-Peng; Ouyang, Min

Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2020-12-02

OAAI

Guo, Hongxuan; Yulaev, Alexander; Strelcov, Evgheni; Tselev, Alexander; Arble, Christopher; Vladar, Andras E.; Villarrubia, John S.; Kolmakov, Andrei

Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution

ANALYTICAL CHEMISTRY

IF6.7

2018-11-25

PREAI

Bustos, Antonio R. Montoro; Purushotham, Kavuri P.; Possolo, Antonio; Farkas, Natalia; Vladar, Andras E.; Murphy, Karen E.; Winchester, Michael R.

Metrology for the next generation of semiconductor devices (vol 1, pg 532, 2018)

NATURE ELECTRONICS

IF40.9

2018-11-09

OAAI

Orji, N. G.; Badaroglu, M.; Barnes, B. M.; Beitia, C.; Bunday, B. D.; Celano, U.; Kline, R. J.; Neisser, M.; Obeng, Y.; Vladar, A. E.

Metrology for the next generation of semiconductor devices 下一代半导体器件的计量

NATURE ELECTRONICS

IF40.9

2018-10-12

329

OAAI

Orji, N. G.; Badaroglu, M.; Barnes, B. M.; Beitia, C.; Bunday, B. D.; Celano, U.; Kline, R. J.; Neisser, M.; Obeng, Y.; Vladar, A. E.

Research Update: Electron beam-based metrology after CMOS

APL MATERIALS

IF4.5

2018-07-19

OAAI

Liddle, J. A.; Hoskins, B. D.; Vladar, A. E.; Villarrubia, J. S.

A method to determine the number of nanoparticles in a cluster using conventional optical microscopes

APPLIED PHYSICS LETTERS

IF3.6

2015-09-10

PREAI

Kang, Hyeonggon; Attota, Ravikiran; Tondare, Vipin; Vladar, Andras E.; Kavuri, Premsagar

Three-dimensional deep sub-wavelength defect detection using λ=193 nm optical microscopy 使用 λ = 193 nm光学显微镜进行三维深亚波长缺陷检测

OPTICS EXPRESS

IF3.3

2013-10-25

OAAI

Barnes, Bryan M.; Sohn, Martin Y.; Goasmat, Francois; Zhou, Hui; Vladar, Andras E.; Silver, Richard M.; Arceo, Abraham

Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopy

NANO LETTERS

IF9.1

2007-01-11

PREAI

Toth, Milos; Lobo, Charlene J.; Knowles, W. Ralph; Phillips, Matthew R.; Postek, Michael T.; Vladar, Andras E.

研究方向