Tanay Karnik - Publications, H-index & Citations

Tanay Karnik

Intel Corporation

44H指数

162论文数

8.2K被引数

收录论文 7

发表时间

A 3-D HBI Compliant 1.536 TB/s/mm2 Bandwidth Scalable Attention Accelerator With 22.5-GOPS Throughput High Speed SoftMax for Quantized Transformers in Intel 3 基于Intel 3工艺的3-D HBI兼容1.536 TB/s/mm²带宽可扩展注意力加速器，配备22.5-GOPS吞吐量高速SoftMax，用于量化Transformer

IEEE Solid-State Circuits Letters

IF2

2026-01-01

PREAI

Budhkar, Prerna; Sciulli, Mirco; Srinivasa, Srivatsa Rangachar; Murali, Gauthaman; Kuttappa, Ragh; Aseron, Paolo; Nguyen, Trang; Honkote, Vinayak; Karnik, Tanay

A Standardized 20-Tb/s Bandwidth Scalable Heterogeneous 2.5-D System Supporting Assembly Time Workload-Dependent Chiplet Configurations 一种标准化的20-Tb/s带宽可扩展异构2.5-D系统，支持装配时间工作负载依赖的裸片配置

IEEE Journal of Solid-State Circuits

IF5.6

2025-10-24

PREAI

Srivatsa Rangachar Srinivasa; Dileep J. Kurian; Paolo A. Aseron; Prerna Budhkar; Vinayak Honkote; Daniel Lake; Mikhail Moiseev; Robert Munoz; Anuradha Srinivasan; Tanay Karnik

Guest Editorial Low-Power, Adaptive Neuromorphic Systems: Devices, Circuit, Architectures and Algorithms

IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS

IF3.8

2018-03-01

OAAI

Basu, Arindam; Chang, Meng-Fan; Chicca, Elisabetta; Karnik, Tanay; Li, Hai; Seo, Jae-Sun

Low-Power, Adaptive Neuromorphic Systems: Recent Progress and Future Directions

IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS

IF3.8

2018-03-01

OAAI

Basu, Arindam; Acharya, Jyotibdha; Karnik, Tanay; Liu, Huichu; Li, Hai; Seo, Jae-Sun; Song, Chang

Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops

IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS

IF3.8

2011-09-01

PREAI

Raychowdhury, Arijit; Tschanz, Jim; Bowman, Keith; Lu, Shih-Lien; Aseron, Paolo; Khellah, Muhammad; Geuskens, Bibiche; Tokunaga, Carlos; Wilkerson, Chris; Karnik, Tanay; De, Vivek

All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS

IF5.2

2011-09-01

PREAI

Bowman, Keith A.; Tokunaga, Carlos; Tschanz, James W.; Raychowdhury, Arijit; Khellah, Muhammad M.; Geuskens, Bibiche M.; Lu, Shih-Lien L.; Aseron, Paolo A.; Karnik, Tanay; De, Vivek K.

Characterization of soft errors caused by single event upsets in CMOS processes

IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING

IF7.5

2004-04-01

420

PREAI

Karnik, T; Hazucha, P; Patel, J

研究方向