Dean G. Jarrett - Publications, H-index & Citations

Dean G. Jarrett

University System of Maryland

15H指数

124论文数

729被引数

收录论文 25

发表时间

Graphene-based quantum Hall array pseudofractal designs via Minkowski-Bouligand algorithms 基于石墨烯的量子霍尔阵列拟分形设计通过Minkowski-Bouligand算法

AIP ADVANCES

IF1.4

2025-10-01

PREAI

Scaletta, Dominick S.; Tran, Ngoc Thanh Mai; Musso, Marta; Jarrett, Dean G.; Hill, Heather M.; Ortolano, Massimo; Newell, David B.; Rigosi, Albert F.

A unified realization of electrical quantities from the quantum International System of Units 期刊名称：Nat. Electron.；作者：LK Rodenbach；发表日期：2025年；DOI：10.1038/s41928-025-01421-2；引用编号：CR1

Nature Electronics

IF40.9

2025-08-12

OAAI

Linsey K. Rodenbach; Jason M. Underwood; Ngoc Thanh Mai Tran; Alireza R. Panna; Molly P. Andersen; Zachary S. Barcikowski; Shamith U. Payagala; Peng Zhang; Lixuan Tai; Kang L. Wang; Dean G. Jarrett; Randolph E. Elmquist; David B. Newell; Albert F. Rigosi; David Goldhaber-Gordon

Optimization of graphene-based quantum Hall arrays for recursive star-mesh transformations

APPLIED PHYSICS LETTERS

IF3.6

2023-10-09

OAAI

Scaletta, D. S.; Mhatre, S. M.; Tran, N. T. M.; Yang, C. H.; Hill, H. M.; Yang, Y.; Meng, L.; Panna, A. R.; Payagala, S. U.; Elmquist, R. E.; Jarrett, D. G.; Newell, D. B.; Rigosi, A. F.

Graphene-Based Star-Mesh Resistance Networks

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2023-01-01

PREAI

Jarrett, Dean G.; Yeh, Ching-Chen; Payagala, Shamith U.; Panna, Alireza R.; Yang, Yanfei; Meng, Linli; Mhatre, Swapnil M.; Tran, Ngoc Thanh Mai; Hill, Heather M.; Saha, Dipanjan; Elmquist, Randolph E.; Newell, David B.; Rigosi, Albert F.

A macroscopic mass from quantum mechanics in an integrated approach

COMMUNICATIONS PHYSICS

IF5.8

2022-12-10

OAAI

Seifert, Frank C. C.; Panna, Alireza R. R.; Hu, I-Fan; Keck, Lorenz H. H.; Chao, Leon S. S.; Payagala, Shamith U. U.; Jarrett, Dean G. G.; Liu, Chieh-, I; Saha, Dipanjan; Elmquist, Randolph E. E.; Schlamminger, Stephan; Rigosi, Albert F. F.; Newell, David B. B.; Haddad, Darine

Metrological Assessment of Quantum Anomalous Hall Properties

PHYSICAL REVIEW APPLIED

IF4.4

2022-09-02

OAAI

Rodenbach, Linsey K.; Panna, Alireza R.; Payagala, Shamith U.; Rosen, Ilan T.; Andersen, Molly P.; Zhang, Peng; Tai, Lixuan; Wang, Kang L.; Jarrett, Dean G.; Elmquist, Randolph E.; Newell, David B.; Goldhaber-Gordon, David; Rigosi, Albert F.

Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2022-01-01

OAAI

Feige, Mona; Schlamminger, Stephan; Koffman, Andrew D.; Jarrett, Dean G.; Payagala, Shamith; Panna, Alireza; Waltrip, Bryan C.; Berilla, Michael; Seifert, Frank; Wang, Yicheng

Onsager-Casimir frustration from resistance anisotropy in graphene quantum Hall devices

PHYSICAL REVIEW B

IF3.7

2021-08-13

OAAI

Hu, I-Fan; Panna, Alireza R.; Rigosi, Albert F.; Kruskopf, Mattias; Patel, Dinesh K.; Liu, Chieh-I; Saha, Dipanjan; Payagala, Shamith U.; Newell, David B.; Jarrett, Dean G.; Liang, Chi-Te; Elmquist, Randolph E.

Graphene quantum Hall effect parallel resistance arrays

PHYSICAL REVIEW B

IF3.7

2021-02-03

OAAI

Panna, Alireza R.; Hu, I-Fan; Kruskopf, Mattias; Patel, Dinesh K.; Jarrett, Dean G.; Liu, Chieh-, I; Payagala, Shamith U.; Saha, Dipanjan; Rigosi, Albert F.; Newell, David B.; Liang, Chi-Te; Elmquist, Randolph E.

Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-12-01

OAAI

Payagala, Shamith U.; Rigosi, Albert F.; Panna, Alireza R.; Pollarolo, Alessio; Kruskopf, Mattias; Schlamminger, Stephan; Jarrett, Dean G.; Brown, Ryan; Elmquist, Randolph E.; Brown, Duane; Newell, David B.

Using a Natural Ratio to Compare DC and AC Resistances

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-08-01

OAAI

Yu, Kwang Min; Jarrett, Dean G.; Koffman, Andrew D.; Rigosi, Albert F.; Payagala, Shamith U.; Ryu, Kwon Sang; Kang, Jeon Hong; Lee, Sang Hwa

Comparison of Multiple Methods for Obtaining PΩ Resistances With Low Uncertainties

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-06-01

OAAI

Yu, Kwang Min; Jarrett, Dean G.; Rigosi, Albert F.; Payagala, Shamith U.; Kraft, Marlin E.

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-06-01

OAAI

Oe, Takehiko; Rigosi, Albert F.; Kruskopf, Mattias; Wu, Bi-Yi; Lee, Hsin-Yen; Yang, Yanfei; Elmquist, Randolph E.; Kaneko, Nobu-Hisa; Jarrett, Dean G.

Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2019-06-01

OAAI

Rigosi, Albert F.; Panna, Alireza R.; Payagala, Shamith U.; Kruskopf, Mattias; Kraft, Marlin E.; Jones, George R.; Wu, Bi-Yi; Lee, Hsin-Yen; Yang, Yanfei; Hu, Jiuning; Jarrett, Dean G.; Newell, David B.; Elmquist, Randolph E.

Towards epitaxial graphene p-n junctions as electrically programmable quantum resistance standards

SCIENTIFIC REPORTS

IF3.9

2018-10-09

OAAI

Hu, Jiuning; Rigosi, Albert F.; Kruskopf, Mattias; Yang, Yanfei; Wu, Bi-Yi; Tian, Jifa; Panna, Alireza R.; Lee, Hsin-Yen; Payagala, Shamith U.; Jones, George R.; Kraft, Marlin E.; Jarrett, Dean G.; Watanabe, Kenji; Taniguchi, Takashi; Elmquist, Randolph E.; Newell, David B.

Report to TIM Editor on CPEM 2012

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2013-06-01

OAAI

Jarrett, Dean G.

SIM Comparison of DC Resistance Standards at 1 Ω, 1 MΩ, and 1 GΩ

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2009-04-01

PREAI

Jarrett, Dean G.; Elmquist, R. E.; Zhang, Nien Fan; Tonina, Alejandra; Porfiri, Marta; Fernandes, Janice de Brito; Schechter, Helio; Izquierdo, Daniel; Faverio, Carlos; Slomovitz, Daniel; Inglis, Dave; Wendler, Kai; Marquez, Felipe Hernandez; Medina, Benjamin Rodriguez

Direct resistance comparisons from the QHR to 100 MΩ using a cryogenic current comparator

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2005-04-01

OAAI

Elmquist, RE; Hourdakis, E; Jarrett, DG; Zimmerman, NM

Statistical uncertainty analysis of key comparison CCEM-K2

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2003-04-01

OAAI

Zhang, NF; Sedransk, N; Jarrett, DG