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P

P. Godard

université de poitiers and cnrs and ensma

25H指数
112论文数
2.5K被引数
收录论文 27
发表时间
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Decoupling Magnetoelastic and Magnetostatic Effects in Nanometric Films on Flexible Substrates Under In Situ Biaxial Multicracking (Adv. Funct. Mater. 40/2026)在柔性衬底纳米薄膜中解耦磁弹效应和静磁效应以实现原位双轴多裂纹 (Adv. Funct. Mater. 40/2026)
errAdvanced Functional Materials
IF19
err2026-05-22
err0
errOAAI
errHatem Ben Mahmoud; Damien Faurie; Pierre-Olivier Renault; Pierre Godard; Dominique Thiaudière; Philippe Joly; Cristian Mocuta; Eloi Haltz; S. Altaf Husain; Noël Girodon-Boulandet; Fatih Zighem
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Influence of Microstructure on Mechanical and Electrical Properties of Indium Tin Oxide Thin Films Deposited on Polymer Substrates微结构对沉积在聚合物基板上的氧化铟锡薄膜的力学和电学性能的影响
errACS Applied Materials & Interfaces
IF0
err2026-04-14
err0
PREAI
errThibault Chommaux; Pierre-Olivier Renault; Pierre Godard; Dominique Thiaudière
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err收藏
Decoupling Magnetoelastic and Magnetostatic Effects in Nanometric Films on Flexible Substrates Under In Situ Biaxial Multicracking在柔性衬底上纳米薄膜在原位双轴多裂纹下的磁弹效应与静磁效应解耦
errAdvanced Functional Materials
IF19
err2026-04-09
err0
PREAI
errHatem Ben Mahmoud; Damien Faurie; Pierre-Olivier Renault; Pierre Godard; Dominique Thiaudière; Philippe Joly; Cristian Mocuta; Eloi Haltz; S. Altaf Husain; Noël Girodon-Boulandet; Fatih Zighem
err分享
err收藏
Charge density waves tuned by biaxial tensile stress
errNATURE COMMUNICATIONS
IF15.7
err2024-04-30
err5
errOAAI
errGallo-Frantz, A.; Jacques, V. L. R.; Sinchenko, A. A.; Ghoneim, D.; Ortega, L.; Godard, P.; Renault, P. -O.; Hadj-Azzem, A.; Lorenzo, J. E.; Monceau, P.; Thiaudiere, D.; Grigoriev, P. D.; Bellec, E.; Le Bolloc'h, D.
err分享
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Elastic energy and interactions between twin boundaries in nanotwinned gold
errCOMPUTATIONAL MATERIALS SCIENCE
IF3.3
err2023-09-01
err1
PREAI
errWoguem, Yen Fred; Godard, Pierre; Durinck, Julien; Brochard, Sandrine
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Atomic scale simulations of {112} symmetric incoherent twin boundaries in gold金的 {112} 对称非相干孪晶界的原子尺度模拟
errMATERIALIA
IF2.9
err2023-03-01
err4
errOAAI
errWoguem, Yen Fred; Godard, Pierre; Durinck, Julien; Brochard, Sandrine
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Strain ratio and thickness effects on plasticity and crack patterns of Nickel thin films
errSCRIPTA MATERIALIA
IF5.6
err2022-05-01
err6
errOAAI
errGodard, P.; Guillot, A.; Zighem, F.; Thiaudiere, D.; Faurie, D.; Renault, P. O.
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X-ray ptychographic topography: A robust nondestructive tool for strain imaging
errPHYSICAL REVIEW B
IF3.7
err2021-04-30
err7
errOAAI
errVerezhak, Mariana; Van Petegem, Steven; Rodriguez-Fernandez, Angel; Godard, Pierre; Wakonig, Klaus; Karpov, Dmitry; Jacques, Vincent L. R.; Menzel, Andreas; Thilly, Ludovic; Diaz, Ana
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90° ferroelectric domain switching effect on interfacial strain mediated magnetoelectric coupling
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2020-01-22
err4
PREAI
errSadat, T.; Faurie, D.; Godard, P.; Thiaudiere, D.; Renault, P-O; Zighem, F.
err分享
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X-ray diffraction and stress relaxations to study thermal and stress-assisted annealings in nanocrystalline gold thin films
errACTA MATERIALIA
IF9.3
err2019-07-01
err4
errOAAI
errGodard, P.; Faurie, D.; Sadat, T.; Drouet, M.; Thiaudiere, D.; Renault, P. O.
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In situ x-ray diffraction analysis of 2D crack patterning in thin films
errACTA MATERIALIA
IF9.3
err2019-02-01
err25
PREAI
errFaurie, D.; Zighem, F.; Godard, P.; Parry, G.; Sadat, T.; Thiaudiere, D.; Renault, P. -O.
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Continuous cyclic deformations of a Ni/W film studied by synchrotron X-ray diffraction通过同步加速器x射线衍射研究的Ni/W膜的连续循环变形
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2017-12-01
err5
PREAI
errRenault, P. O.; Sadat, T.; Godard, P.; He, W.; Guerin, P. H.; Geandier, G.; Blanc, N.; Boudet, N.; Goudeau, P.
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Revealing crystalline domains in a mollusc shell single-crystalline prism
errNATURE MATERIALS
IF38.5
err2017-07-10
err43
errOAAI
errMastropietro, F.; Godard, P.; Burghammer, M.; Chevallard, C.; Daillant, J.; Duboisset, J.; Allain, M.; Guenoun, P.; Nouet, J.; Chamard, V.
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Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction
errAPPLIED PHYSICS LETTERS
IF3.6
err2017-05-22
err10
PREAI
errGodard, Pierre; Renault, Pierre-Olivier; Faurie, Damien; Thiaudiere, Dominique
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Nano-structuration effect on the mechanical behavior of gold thin films studied by 2D synchrotron x-ray diffraction
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2016-12-01
err2
PREAI
errGuillou, R.; Le Bourhis, E.; Goudeau, P.; Renault, P. -O; Godard, P.; Faurie, D.; Geandier, G.; Mocuta, C.; Thiaudiere, D.
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Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure
errPHYSICAL REVIEW B
IF3.7
err2015-11-13
err24
errOAAI
errPateras, A. I.; Allain, M.; Godard, P.; Largeau, L.; Patriarche, G.; Talneau, A.; Pantzas, K.; Burghammer, M.; Minkevich, A. A.; Chamard, V.
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Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography
errSCIENTIFIC REPORTS
IF3.9
err2015-05-18
err42
errOAAI
errChamard, V.; Allain, M.; Godard, P.; Talneau, A.; Patriarche, G.; Burghammer, M.
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X-ray lensless microscopy from undersampled diffraction intensities
errPHYSICAL REVIEW B
IF3.7
err2013-10-01
err18
errOAAI
errBerenguer, F.; Godard, P.; Allain, M.; Belloir, J. -M.; Talneau, A.; Ravy, S.; Chamard, V.
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Noise models for low counting rate coherent diffraction imaging
errOPTICS EXPRESS
IF3.3
err2012-11-01
err87
errOAAI
errGodard, Pierre; Allain, Marc; Chamard, Virginie; Rodenburg, John
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Three-dimensional high-resolution quantitative microscopy of extended crystals扩展晶体的三维高分辨率定量显微镜
errNATURE COMMUNICATIONS
IF15.7
err2011-11-29
err128
errOAAI
errGodard, P.; Carbone, G.; Allain, M.; Mastropietro, F.; Chen, G.; Capello, L.; Diaz, A.; Metzger, T. H.; Stangl, J.; Chamard, V.
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研究方向

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