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W
Walid Ibrahim
United Arab Emirates University
16
H指数
108
论文数
815
被引数
0
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8
发表时间
发表时间
IF
被引数
Multithreaded and Reconvergent Aware Algorithms for Accurate Digital Circuits Reliability Estimation
IEEE TRANSACTIONS ON RELIABILITY
IF
5.7
2019-06-01
13
PRE
AI
Ibrahim, Walid; Ibrahim, Hazem
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Identifying the Worst Reliability Input Vectors and the Associated Critical Logic Gates
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2016-06-01
15
PRE
AI
Ibrahim, Walid
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Accurate and Efficient Estimation of Logic Circuits Reliability Bounds
IEEE TRANSACTIONS ON COMPUTERS
IF
3.8
2015-05-01
16
PRE
AI
Ibrahim, Walid; Shousha, Marwa; Chinneck, John W.
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Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates
互补金属氧化物半导体栅极的最佳可靠性尺寸
IEEE TRANSACTIONS ON RELIABILITY
IF
5.7
2012-09-01
17
PRE
AI
Ibrahim, Walid; Beiu, Valeriu; Beg, Azam
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Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates
IEEE TRANSACTIONS ON RELIABILITY
IF
5.7
2011-09-01
36
PRE
AI
Ibrahim, Walid; Beiu, Valeriu
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An adaptive heuristic algorithm for VLSI test vectors selection
EUROPEAN JOURNAL OF OPERATIONAL RESEARCH
IF
6
2009-12-01
1
PRE
AI
Ibrahim, Walid; El-Sayed, Hesham; El-Chouemie, Amr; Amer, Hoda
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Improving, solver success in reaching feasibility for sets of nonlinear constraints
COMPUTERS & OPERATIONS RESEARCH
IF
4.3
2008-05-01
18
PRE
AI
Ibrahim, Walid; Chinneck, John W.
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Serial addition: Locally connected architectures
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF
5.2
2007-11-01
12
PRE
AI
Beiu, Valeriu; Aunet, Snorre; Nyathi, Jabulani; Rydberg, Robert R., III; Ibrahim, Walid
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研究方向
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合作学者
合作期刊
H
Hesham El‐Sayed
H 指数: 23 · 论文数: 119
J
John W. Chinneck
H 指数: 22 · 论文数: 107
V
Valeriu Beiu
H 指数: 20 · 论文数: 256
S
Snorre Aunet
H 指数: 18 · 论文数: 134
A
Azam Beg
H 指数: 12 · 论文数: 100
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