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Bin Yang

National Key Laboratory of Advanced Micro and Nano Manufacture Technology

4H指数
26论文数
51被引数
收录论文 4
发表时间
Sizing of Defect Using Magnetic Memory Signal Based on the Reconstruction Algorithm
err2018-01-01
err11
errOAAI
errLi, Hongmei; Wang, Yu; Huang, Ranran; Zhang, Fuchen; Yang, Bin
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Special section on Statistical Signal and Array Processing
err2010-05-01
err0
PREAI
errZoubir, Abdelhak; Viberg, Mats; Yang, Bin
err分享
err收藏