arrow
返回
D

David Ren

University of California System

8H指数
40论文数
487被引数
收录论文 5
发表时间
Ion complexation waves emerge at the curved interfaces of layered minerals
err2022-06-13
err11
errOAAI
errWhittaker, Michael L.; Ren, David; Ophus, Colin; Zhang, Yugang; Waller, Laura; Gilbert, Benjamin; Banfield, Jillian F.
err分享
err收藏
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry
err2021-01-29
err73
errOAAI
errTanksalvala, Michael; Porter, Christina L.; Esashi, Yuka; Wang, Bin; Jenkins, Nicholas W.; Zhang, Zhe; Miley, Galen P.; Knobloch, Joshua L.; McBennett, Brendan; Horiguchi, Naoto; Yazdi, Sadegh; Zhou, Jihan; Jacobs, Matthew N.; Bevis, Charles S.; Karl, Robert M., Jr.; Johnsen, Peter; Ren, David; Waller, Laura; Adams, Daniel E.; Cousin, Seth L.; Liao, Chen-Ting; Miao, Jianwei; Gerrity, Michael; Kapteyn, Henry C.; Murnane, Margaret M.
err分享
err收藏
Multi-layer Born multiple-scattering model for 3D phase microscopy (vol 7, pg 394, 2020)
errOPTICA
IF8.5
err2020-08-04
err0
errOAAI
errHen, Michael C.; Ren, David; Liu, Hsiou-Yuan; Chowdhury, Shwetadwip; Waller, Laura
err分享
err收藏
Multi-layer Born multiple-scattering model for 3D phase microscopy3D相位显微镜的多层Born多重散射模型
errOPTICA
IF8.5
err2020-04-28
err113
errOAAI
errChen, Michael; Ren, David; Liu, Hsiou-Yuan; Chowdhury, Shwetadwip; Waller, Laura
err分享
err收藏
High-resolution 3D refractive index microscopy of multiple-scattering samples from intensity images来自强度图像的多散射样品的高分辨率3D折射率显微镜
errOPTICA
IF8.5
err2019-09-16
err161
errOAAI
errChowdhury, Shwetadwip; Chen, Michael; Eckert, Regina; Ren, David; Wu, Fan; Repina, Nicole; Waller, Laura
err分享
err收藏