M. Hecker - Publications, H-index & Citations

M. Hecker

机构信息待补充

22H指数

129论文数

1.4K被引数

收录论文 9

发表时间

Raman intensity enhancement in silicon-on-insulator substrates by laser deflection at atomic force microscopy tips and particles

APPLIED PHYSICS LETTERS

IF3.6

2007-04-23

PREAI

Georgi, Carsten; Hecker, Michael; Zschech, Ehrenfried

Polarized soft-x-ray reflection spectroscopy of giant magnetoresistive Co/Cu multilayers

PHYSICAL REVIEW B

IF3.7

2005-08-24

PREAI

Hecker, M; Valencia, S; Oppeneer, PM; Mertins, HC; Schneider, CM

Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates

ANALYTICAL AND BIOANALYTICAL CHEMISTRY

IF3.8

2004-04-06

PREAI

Hübner, R; Hecker, M; Mattern, N; Hoffmann, V; Wetzig, K; Engelmann, HJ; Zschech, E

Thermally induced modification of GMR in Co/Cu multilayers: correlation among structural, transport, and magnetic properties

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2003-02-14

PREAI

Hecker, M; Thomas, J; Tietjen, D; Baunack, S; Schneider, CM; Qiu, A; Cramer, N; Camley, RE; Celinski, Z

Investigation of the tensor character of mesoscopic internal stresses in tensile-deformed nickel single crystals by X-ray diffraction

ACTA MATERIALIA

IF9.3

2002-05-01

PREAI

Hecker, M; Thiele, E; Holste, C

Stress measurements in thermal loaded (Ti,Al) N hard coatings

SURFACE & COATINGS TECHNOLOGY

IF6.1

2001-07-01

PREAI

Göbel, T; Menzel, S; Hecker, M; Brückner, W; Wetzig, K; Genzel, C

Interdiffusion in NiFe/Cu/NiFe trilayers:: Possible failure mechanism for magnetoelectronic devices (vol 77, pg 358, 2000)

APPLIED PHYSICS LETTERS

IF3.6

2000-08-14

OAAI

Brückner, W; Baunack, S; Hecker, M; Monch, JI; van Loyen, L; Schneider, CM

Stress fields of tilted dislocation walls

COMPUTATIONAL MATERIALS SCIENCE

IF3.3

1998-07-01

PREAI

Sedlacek, R; Hecker, M

X-ray diffraction analysis of internal stresses in the dislocation structure of cyclically deformed nickel single crystals

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

IF7

1997-08-01

PREAI

Hecker, M; Thiele, E; Holste, C

研究方向