Andreas Schulze - Publications, H-index & Citations

Andreas Schulze

atotech deutschland gmbh

18H指数

117论文数

1.5K被引数

收录论文 13

发表时间

Design of a Phase 3 study of AAV-mediated gene transfer of ornithine transcarbamylase (OTC) in patients with late-onset OTC deficiency

MOLECULAR GENETICS AND METABOLISM

IF3.5

2024-04-01

PREAI

Konczal, Laura; Baker, Joshua; Wagenmakers, Margreet; Arnoux, Jean Baptiste; Burrow, T. Andrew; Couce, Marie Luz; del Toro, Mireia; Guelbert, Norberto; Kleppe, Soledad; Lipshutz, Gerald S.; Longo, Nicola; Matsumoto, Shiro; Schulze, Andreas; Thomas, Janet; Merritt, J. Lawrence, II

Thermal evolution, phase composition and fracture toughness of electroless Ni-P, Ni-W-P and Ni-Mo-W-P films for solderable surfaces on copper

SURFACE & COATINGS TECHNOLOGY

IF6.1

2023-08-01

PREAI

Sharma, Tanu; Bera, Holger; Brown, Delilah A.; Schulze, Andreas; Bruening, Ralf

Size-dependent optical properties of periodic arrays of semiconducting nanolines

OPTICS EXPRESS

IF3.3

2020-02-21

OAAI

Gawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Morin, Pierre; Misiewicz, Jan; Vandervorst, Wilfried

Enhanced light coupling into periodic arrays of nanoscale semiconducting fins

APPLIED PHYSICS LETTERS

IF3.6

2018-08-07

PREAI

Gawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Nuytten, Thomas; Tarnowski, Karol; Misiewicz, Jan; Vandervorst, Wilfried

Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy

APL MATERIALS

IF4.5

2018-01-10

OAAI

Nuytten, T.; Bogdanowicz, J.; Witters, L.; Eneman, G.; Hantschel, T.; Schulze, A.; Favia, P.; Bender, H.; De Wolf, I.; Vandervorst, W.

Non-destructive characterization of extended crystalline defects in confined semiconductor device structures

NANOSCALE

IF5.1

2018-01-01

OAAI

Schulze, Andreas; Strakos, Libor; Vystavel, Tomas; Loo, Roger; Pacco, Antoine; Collaert, Nadine; Vandervorst, Wilfried; Caymax, Matty

Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2017-04-10

PREAI

Shida, Kazuki; Takeuchi, Shotaro; Imai, Yasuhiko; Kimura, Shigeru; Schulze, Andreas; Caymax, Matty; Sakai, Akira

Advanced Raman Spectroscopy Using Nanofocusing of Light

ADVANCED ENGINEERING MATERIALS

IF3.3

2017-01-13

PREAI

Nuytten, Thomas; Bogdanowicz, Janusz; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried

Nanofocusing of light into semiconducting fin photonic crystals

APPLIED PHYSICS LETTERS

IF3.6

2016-02-23

OAAI

Bogdanowicz, J.; Nuytten, T.; Gawlik, A.; Schulze, A.; De Wolf, I.; Vandervorst, W.

Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels

APPLIED PHYSICS LETTERS

IF3.6

2015-01-22

PREAI

Nuytten, T.; Hantschel, T.; Kosemura, D.; Schulze, A.; De Wolf, I.; Vandervorst, W.

Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices 纳米尺度电阻式存储器件中导电细丝的三维观察

NANO LETTERS

IF9.1

2014-04-10

303

PREAI

Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Opsomer, Karl; Franquet, Alexis; Schulze, Andreas; Detavernier, Christophe; Richard, Olivier; Bender, Hugo; Jurczak, Malgorzata; Vandervorst, Wilfried

Direct Imaging of 3D Atomic-Scale Dopant-Defect Clustering Processes in Ion-Implanted Silicon

NANO LETTERS

IF9.1

2013-05-21

PREAI

Koelling, S.; Richard, O.; Bender, H.; Uematsu, M.; Schulze, A.; Zschaetzsch, G.; Gilbert, M.; Vandervorst, W.

Diameter-dependent boron diffusion in silicon nanowire-based transistors

APPLIED PHYSICS LETTERS

IF3.6

2013-02-05

PREAI

Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne S.; Rooyackers, Rita; Vandooren, Anne; Vandervorst, W.

研究方向