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收藏Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography
Sunday, Daniel F.; Chen, Xuanxuan; Albrecht, Thomas R.; Nowak, Derek; Delgadillo, Paulina Rincon; Dazai, Takahiro; Miyagi, Ken; Maehashi, Takaya; Yamazaki, Akiyoshi; Nealey, Paul F.; Kline, R. Joseph
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收藏Spectroscopic Nanoimaging of All-Semiconductor Plasmonic Gratings Using Photoinduced Force and Scattering Type Nanoscopy
Huang, Yi; Legrand, David; Vincent, Remi; Foli, Ekoue Athos Dogbe; Nowak, Derek; Lerondel, Gilles; Bachelot, Renaud; Taliercio, Thierry; Barho, Franziska; Cerutti, Laurent; Gonzalez-Posada, Fernando; Tay, Beng Kang; Bruyant, Aurelien
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收藏Nanoscale chemical imaging by photoinduced force microscopy
Nowak, Derek; Morrison, William; Wickramasinghe, H. Kumar; Jahng, Junghoon; Potma, Eric; Wan, Lei; Ruiz, Ricardo; Albrecht, Thomas R.; Schmidt, Kristin; Frommer, Jane; Sanders, Daniel P.; Park, Sung
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