未登录 Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE MBE快速平面氧化锡镓uv-c光电探测器中缺陷在超高增益中的作用 Mukhopadhyay, Partha; Hatipoglu, Isa; Frodason, Ymir K.; Varley, Joel B.; Williams, Martin S.; Hunter, Daniel A.; Gunasekar, Naresh K.; Edwards, Paul R.; Martin, Robert W.; Wu, Feng; Mauze, Akhil; Speck, James S.; Schoenfeld, Winston V. 分享 收藏
High Figure-of-Merit Gallium Oxide UV Photodetector on Silicon by Molecular Beam Epitaxy: A Path toward Monolithic Integration Mukhopadhyay, Partha; Hatipoglu, Isa; Sakthivel, Tamil Selvan; Hunter, Daniel A.; Edwards, Paul R.; Martin, Robert W.; Naresh-Kumar, Gunasekar; Seal, Sudipta; Schoenfeld, Winston, V 分享 收藏
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Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Studies of Hole-Selective Molybdenum Oxide Contacts in Silicon Solar Cells 硅太阳能电池中空穴选择性氧化钼接触的透射电子显微镜和电子能量损失谱研究 Ali, Haider; Maynau, Celine; Lajaunie, Luc; Gregory, Geoffrey; Wu, Lijun; Looney, John Patrick; Zhu, Yimei; Schneider, Matthew; Schoenfeld, Winston V.; Davis, Kristopher O. 分享 收藏
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Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing Schneller, Eric J.; Brooker, R. Paul; Shiradkar, Narendra S.; Rodgers, Marianne P.; Dhere, Neelkanth G.; Davis, Kristopher O.; Seigneur, Hubert P.; Mohajeri, Nahid; Wohlgemuth, John; Scardera, Giuseppe; Rudack, Andrew C.; Schoenfeld, Winston V. 分享 收藏
Manufacturing metrology for c-Si module reliability and durability Part II: Cell manufacturing Davis, Kristopher O.; Rodgers, Marianne P.; Scardera, Giuseppe; Brooker, R. Paul; Seigneur, Hubert; Mohajeri, Nahid; Dhere, Neelkanth G.; Wohlgemuth, John; Schneller, Eric; Shiradkar, Narendra; Rudack, Andrew C.; Schoenfeld, Winston V. 分享 收藏
Manufacturing metrology for c-Si photovoltaic module reliability and durability, Part I: Feedstock, crystallization and wafering Seigneur, Hubert; Mohajeri, Nahid; Brooker, R. Paul; Davis, Kristopher O.; Schneller, Eric J.; Dhere, Neelkanth G.; Rodgers, Marianne P.; Wohlgernuth, John; Shiradkar, Narendra S.; Scardera, Giuseppe; Rudack, Andrew C.; Schoenfeld, Winston V. 分享 收藏
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