arrow
返回
K

K. R. Murali

p institute of technology

24H指数
342论文数
2.7K被引数
收录论文 45
发表时间
Exploring the efficacy of using various coolants on lithium-ion 18650 cell employing conjugate heat transfer simulation
err2020-01-01
err4
PREAI
errSharma, M. Sanjay; Jayagopal, Adarsh; Ramesha, D. K.; Murali, K.; Tiwari, Pragyat
err分享
err收藏
Pulse electrodeposited copper indium sulfide films
err2013-06-01
err11
PREAI
errVadivel, S.; Srinivasan, K.; Murali, K. R.
err分享
err收藏
err分享
err收藏
Performance of Zn-polyaniline rechargeable battery
err2011-11-21
err1
PREAI
errParamasivam, M; Jayachandran, M; Murali, KR; Trivedi, DC; Raghavan, M
err分享
err收藏
Characteristics of GZO thin films deposited by sot-gel dip coating
err2011-06-01
err16
PREAI
errKalaivanan, A.; Perumal, S.; Pillai, N. Neelakanda; Murali, K. R.
err分享
err收藏
Development of porous silicon matrix and characteristics of porous silicon/tin oxide structures
err2011-03-01
err3
PREAI
errVidhya, V. S.; Padmavathy, P.; Murali, K. R.; Sanjeeviraja, C.; Manisankar, P.; Jayachandran, M.
err分享
err收藏
Photoluminescent studies on porous silicon/tin oxide heterostructures
err2011-02-01
err3
PREAI
errVidhya, V. S.; Murali, K. R.; Subramanian, B.; Manisankar, P.; Sanjeeyiraja, C.; Jayachandran, M.
err分享
err收藏
err分享
err收藏
Sol-gel dip coated CdO:Al films
err2010-08-01
err74
PREAI
errMurali, K. R.; Kalaivanan, A.; Perumal, S.; Pillai, N. Neelakanda
err分享
err收藏
Influence of thickness on the microstructural, optoelectronic and morphological properties of nanocrystalline ZnSe thin films
err2010-07-01
err28
PREAI
errBalu, A. R.; Nagarethinam, V. S.; Ahamed, M. G. Syed Basheer; Thayumanavan, A.; Murali, K. R.; Sanjeeviraja, C.; Swaminathan, V.; Jayachandran, M.
err分享
err收藏
Effect of thickness on the microstructural, optoelectronic and morphological properties of electron beam evaporated ZnTe films
err2010-07-01
err31
PREAI
errBalu, A. R.; Nagarethinam, V. S.; Thayumanavan, A.; Murali, K. R.; Sanjeeviraja, C.; Jayachandran, M.
err分享
err收藏
Properties of CdS films deposited by the electron beam evaporation technique
err2010-07-01
err26
PREAI
errSivaramamoorthy, K.; Bahadur, S. Asath; Kottaisamy, M.; Murali, K. R.
err分享
err收藏