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Samuel Bassetto

communaute universite grenoble alpes

13H指数
97论文数
514被引数
收录论文 21
发表时间
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Beyond the lab: Feasibility of cognitive neuroscience data collection during a speleological expedition
errJOURNAL OF ENVIRONMENTAL PSYCHOLOGY
IF7
err2024-11-01
err0
errOAAI
errPaas, Anita; Jourde, Hugo R.; Brignol, Arnaud; Savard, Marie-Anick; Eyqvelle, Zseyvfin; Bassetto, Samuel; Beltrame, Giovanni; Coffey, Emily B. J.
err分享
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Condition monitoring and warning of a belt drive system based on a logical analysis of data regression-based residual control chart
errSTRUCTURAL HEALTH MONITORING-AN INTERNATIONAL JOURNAL
IF5.7
err2024-07-24
err0
PREAI
errKhalifa, Ramy M.; Yacout, Soumaya; Bassetto, Samuel; Shaban, Yasser
err分享
err收藏
The missing link between project and product risk management: From the review to the call to action
errJOURNAL OF ENGINEERING AND TECHNOLOGY MANAGEMENT
IF3.9
err2023-07-01
err2
PREAI
errPetronijevic, Jelena; Etienne, Alain; Bassetto, Samuel; Siadat, Ali
err分享
err收藏
Root cause analysis of an out-of-control process using a logical analysis of data regression model and exponential weighted moving average
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2023-04-05
err4
PREAI
errKhalifa, Ramy M.; Yacout, Soumaya; Bassetto, Samuel
err分享
err收藏
Aligning work analysis and modeling with the engineering goals of a Cyber-Physical-Social System for industrial inspection
errAPPLIED ERGONOMICS
IF3.4
err2022-07-01
err2
PREAI
errCabour, G.; Ledoux, E.; Bassetto, S.
err分享
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Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems半导体制造系统中自适应调度的仿真和深度强化学习
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2021-10-08
err19
PREAI
errSakr, Ahmed H.; Aboelhassan, Ayman; Yacout, Soumaya; Bassetto, Samuel
err分享
err收藏
Developing machine-learning regression model with Logical Analysis of Data (LAD)
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2021-01-01
err14
PREAI
errKhalifa, Ramy M.; Yacout, Soumaya; Bassetto, Samuel
err分享
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Adoption of infection prevention and control practices by healthcare workers in Quebec: A qualitative study
errINFECTION CONTROL AND HOSPITAL EPIDEMIOLOGY
IF3
err2019-10-18
err5
PREAI
errDube, Eve; Lorcy, Armelle; Audy, Nathalie; Desmarais, Nadia; Savard, Patrice; Soucy, Chantal; Bassetto, Samuel; Rajon, Mathilde; Brunet, Fabrice; Barbir, Caroline; Quach, Caroline
err分享
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Impact of type-II inspection errors on a risk exposure control approach based quality inspection planII型检查错误对基于风险暴露控制方法的质量检查计划的影响
errJOURNAL OF MANUFACTURING SYSTEMS
IF14.2
err2016-07-01
err4
PREAI
errBettayeb, B.; Bassetto, S-J.
err分享
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Quality control planning to prevent excessive scrap production
errJOURNAL OF MANUFACTURING SYSTEMS
IF14.2
err2014-07-01
err22
PREAI
errBettayeb, B.; Bassetto, S. J.; Sahnoun, M.
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A method for a robust optimization of joint product and supply chain design一种产品与供应链联合设计的鲁棒优化方法
errJOURNAL OF INTELLIGENT MANUFACTURING
IF7.4
err2014-04-04
err20
PREAI
errBaud-Lavigne, Bertrand; Bassetto, Samuel; Agard, Bruno
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Controlling non-conformities propagation in manufacturing
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2013-06-18
err5
PREAI
errFiegenwald, V.; Bassetto, S.; Tollenaere, M.
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Modular design of product families for quality and cost
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2013-03-15
err63
PREAI
errAgard, Bruno; Bassetto, Samuel
err分享
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Quality and exposure control in semiconductor manufacturing. Part II: Evaluation
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2012-12-01
err7
PREAI
errBettayeb, Belgacem; Bassetto, Samuel; Vialletelle, Philippe; Tollenaere, Michel
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Quality and exposure control in semiconductor manufacturing. Part I: Modelling
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2012-12-01
err12
PREAI
errBettayeb, Belgacem; Bassetto, Samuel; Vialletelle, Philippe; Tollenaere, Michel
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Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2011-07-01
err13
errOAAI
errShanoun, M.; Bassetto, S.; Bastoini, S.; Vialletelle, P.
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The management of process control deployment using interactions in risks analyses
errJOURNAL OF LOSS PREVENTION IN THE PROCESS INDUSTRIES
IF4.2
err2011-07-01
err7
PREAI
errBassetto, Samuel; Siadat, Ali; Tollenaere, Michel
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Unified Process for Action Plan Management: Case Study in a Research and Production Semiconductor Factory
errIEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE
IF3.8
err2010-06-01
err3
PREAI
errMili, Aymen; Siadat, A.; Bassetto, S.; Hubac, S.; Tollenaere, M.
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A broader view of the economic design of the X-bar chart in the semiconductor industry
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2009-11-06
err18
errOAAI
errBaud-Lavigne, B.; Bassetto, S.; Penz, B.
err分享
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Dynamic risk management unveil productivity improvements
errJOURNAL OF LOSS PREVENTION IN THE PROCESS INDUSTRIES
IF4.2
err2009-01-01
err40
PREAI
errMili, Aymen; Bassetto, Samuel; Siadat, Ali; Tollenaere, Michel
err分享
err收藏

研究方向

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合作学者
合作期刊
È
Ève Dubé
H 指数: 49 · 论文数: 317
C
Caroline Quach
H 指数: 38 · 论文数: 368
F
Fabrice Brunet
H 指数: 35 · 论文数: 133
B
Bruno Agard
H 指数: 28 · 论文数: 154
S
Soumaya Yacout
H 指数: 27 · 论文数: 387
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