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S. Hofmann

Braunschweig University of Technology

54H指数
297论文数
1.0W被引数
收录论文 32
发表时间
Entropy matters in grain boundary segregation
err2021-03-01
err32
PREAI
errLejcek, P.; Hofmann, S.; Vsianska, M.; Sob, M.
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Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES
err2019-07-01
err14
PREAI
errHofmann, S.; Zhou, G.; Kovac, J.; Drev, S.; Lian, S. Y.; Lin, B.; Liu, Y.; Wang, J. Y.
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The Significance of Entropy in Grain Boundary Segregation
err2019-02-05
err17
errOAAI
errLejcek, Pavel; Hofmann, Siegfried; Paidar, Vaclav
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Depth resolution and preferential sputtering in depth profiling of delta layers
err2018-10-01
err9
PREAI
errHofmann, S.; Lian, S. Y.; Han, Y. S.; Liu, Y.; Wang, J. Y.
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Analytical and numerical depth resolution functions in sputter profiling
err2014-09-01
err28
PREAI
errHofmann, S.; Liu, Y.; Wang, J. Y.; Kovac, J.
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Influence of non-Gaussian roughness on sputter depth profiles
err2013-07-01
err18
PREAI
errLiu, Y.; Jian, W.; Wang, J. Y.; Hofmann, S.; Kovac, J.
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AES depth profiling and interface analysis of C/Ta bilayers
err2005-12-01
err12
PREAI
errZalar, A; Kovac, J; Pracek, B; Hofmann, S; Panjan, P
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