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S
S. Hofmann
Braunschweig University of Technology
54
H指数
297
论文数
1.0W
被引数
0
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32
发表时间
发表时间
IF
被引数
Tailoring Momentum and Information Transfer of Structured Light to Adapted Liquid Crystals
调节结构光的动量和信息传递以适应液晶
ACS OMEGA
IF
4.3
2025-12-01
0
PRE
AI
Hofmann, Silvia; Lemmens, Peter; Moller, Angela
分享
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Entropy matters in grain boundary segregation
ACTA MATERIALIA
IF
9.3
2021-03-01
32
PRE
AI
Lejcek, P.; Hofmann, S.; Vsianska, M.; Sob, M.
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Entropy-dominated grain boundary segregation
JOURNAL OF MATERIALS SCIENCE
IF
3.9
2021-01-25
7
PRE
AI
Lejcek, P.; Hofmann, S.
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Artifacts in multilayer depth profiling: Origin and quantification of a double peak layer profile of Ag in ToF-SIMS depth profiles of an Ag/Ni multilayer
MATERIALS CHARACTERIZATION
IF
5.5
2021-01-01
2
PRE
AI
Hofmann, S.; Yang, H.; Kovac, J.; Ekar, J.; Song, Y. B.; Wang, J. Y.
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Prediction and experimental determination of the layer thickness in SIMS depth profiling of Ge/Si multilayers: Effect of preferential sputtering and atomic mixing
APPLIED SURFACE SCIENCE
IF
6.9
2019-07-01
3
PRE
AI
Lian, S. Y.; Kim, K. J.; Kim, T. G.; Hofmann, S.; Wang, J. Y.
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Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES
APPLIED SURFACE SCIENCE
IF
6.9
2019-07-01
14
PRE
AI
Hofmann, S.; Zhou, G.; Kovac, J.; Drev, S.; Lian, S. Y.; Lin, B.; Liu, Y.; Wang, J. Y.
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Modeling grain boundary segregation by prediction of all the necessary parameters
ACTA MATERIALIA
IF
9.3
2019-05-01
24
PRE
AI
Lejcek, Pavel; Hofmann, Siegfried
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The Significance of Entropy in Grain Boundary Segregation
MATERIALS
IF
3.2
2019-02-05
17
OA
AI
Lejcek, Pavel; Hofmann, Siegfried; Paidar, Vaclav
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Depth resolution and preferential sputtering in depth profiling of delta layers
APPLIED SURFACE SCIENCE
IF
6.9
2018-10-01
9
PRE
AI
Hofmann, S.; Lian, S. Y.; Han, Y. S.; Liu, Y.; Wang, J. Y.
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Depth resolution and preferential sputtering in depth profiling of sharp interfaces
APPLIED SURFACE SCIENCE
IF
6.9
2017-07-01
25
PRE
AI
Hofmann, S.; Han, Y. S.; Wang, J. Y.
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Comment on Mitigating grain growth in binary nanocrystalline alloys through solute selection based on thermodynamic stability maps''
COMPUTATIONAL MATERIALS SCIENCE
IF
3.3
2015-09-01
1
PRE
AI
Lejcek, P.; Hofmann, S.
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Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper
APPLIED SURFACE SCIENCE
IF
6.9
2015-03-01
23
PRE
AI
Liu, Y.; Jian, W.; Wang, J. Y.; Hofmann, S.; Shimizu, K.
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Analytical and numerical depth resolution functions in sputter profiling
APPLIED SURFACE SCIENCE
IF
6.9
2014-09-01
28
PRE
AI
Hofmann, S.; Liu, Y.; Wang, J. Y.; Kovac, J.
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Influence of non-Gaussian roughness on sputter depth profiles
APPLIED SURFACE SCIENCE
IF
6.9
2013-07-01
18
PRE
AI
Liu, Y.; Jian, W.; Wang, J. Y.; Hofmann, S.; Kovac, J.
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Microimprinting of nanocrystalline metals - Influence of microstructure and work hardening
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY
IF
7.5
2010-10-01
16
PRE
AI
Durst, K.; Hofmann, S.; Backes, B.; Mueller, J.; Goeken, M.
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Thermodynamics of grain boundary segregation and applications to anisotropy, compensation effect and prediction
晶界偏析的热力学及其在各向异性,补偿效应和预测中的应用
CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES
IF
8.9
2008-05-19
75
PRE
AI
Lejcek, Pavel; Hofmann, Siegfried
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Prediction of enthalpy and entropy of solute segregation at individual grain boundaries of α-iron and ferrite steels
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
IF
7
2007-07-01
35
PRE
AI
Lejcek, P.; Hofmann, S.; Janovec, J.
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AES depth profiling and interface analysis of C/Ta bilayers
APPLIED SURFACE SCIENCE
IF
6.9
2005-12-01
12
PRE
AI
Zalar, A; Kovac, J; Pracek, B; Hofmann, S; Panjan, P
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Texture analysis for tissue discrimination on T1-weighted MR images of the knee joint in a multicenter study: Transferability of texture features and comparison of feature selection methods and classifiers
JOURNAL OF MAGNETIC RESONANCE IMAGING
IF
3.5
2005-10-07
49
OA
AI
Mayerhoefer, ME; Breitenseher, MJ; Kramer, J; Aigner, N; Hofmann, S; Materka, A
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Characterization of nanolayers by sputter depth profiling
APPLIED SURFACE SCIENCE
IF
6.9
2005-02-01
40
PRE
AI
Hofmann, S
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研究方向
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合作学者
合作期刊
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Ken‐ichi Shimizu
H 指数: 95 · 论文数: 1.2K
B
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H 指数: 78 · 论文数: 496
G
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H 指数: 53 · 论文数: 287
K
Karsten Durst
H 指数: 51 · 论文数: 237
E
Eugen Rabkin
H 指数: 49 · 论文数: 389
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