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Balasubramaniam Radhakrishnan

oak ridge national laboratory

13H指数
67论文数
742被引数
收录论文 10
发表时间
Massively parallel phase-field simulations targeting exascale大规模并行相场模拟瞄准艾级规模
err2025-10-21
err0
PREAI
errSupriyo Ghosh; Christopher K. Newman; Stephen DeWitt; Jean-Luc Fattebert; Balasubramaniam Radhakrishnan; John Coleman; Stephen Nichols; James Belak
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GrainGNN: A dynamic graph neural network for predicting 3D grain microstructure
err2024-08-01
err0
errOAAI
errQin, Yigong; Dewitt, Stephen; Radhakrishnan, Balasubramaniam; Biros, George
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ExaAM: Metal additive manufacturing simulation at the fidelity of the microstructure
err2022-01-10
err28
PREAI
errTurner, John A.; Belak, James; Barton, Nathan; Bement, Matthew; Carlson, Neil; Carson, Robert; DeWitt, Stephen; Fattebert, Jean-Luc; Hodge, Neil; Jibben, Zechariah; King, Wayne; Levine, Lyle; Newman, Christopher; Plotkowski, Alex; Radhakrishnan, Balasubramaniam; Reeve, Samuel Temple; Rolchigo, Matthew; Sabau, Adrian; Slattery, Stuart; Stump, Benjamin
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A sharp interface model for deterministic simulation of dendrite growth
err2019-11-01
err12
errOAAI
errRamanuj, Vimal; Sankaran, Ramanan; Radhakrishnan, Balasubramaniam
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Large Discrete Resistance Jump at Grain Boundary in Copper Nanowire
err2010-07-07
err147
PREAI
errKim, Tae-Hwan; Zhang, X. -G.; Nicholson, Don M.; Evans, Boyd M.; Kulkarni, Nagraj S.; Radhakrishnan, B.; Kenik, Edward A.; Li, An-Ping
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Thin-film adhesion measurement using laser-generated high-power surface acoustic wave
err2006-05-10
err2
PREAI
errKireev, V.; Liu, Y.; Braiman, Y.; Radhakrishnan, B.; Hsueh, C. H.; Becher, P. F.
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