arrow
返回
S

Sangsig Kim

korea university

37H指数
350论文数
7.0K被引数
收录论文 111
发表时间
Effect of interface defects on electrical characteristics of a-ITGZO TFTs under bottom, top, and dual gatings
errHELIYON
IF3.6
err2024-07-01
err0
errOAAI
errKang, Mingu; Cho, Kyoungah; Seol, Minhyeok; Kim, Sangsub; Kim, Sangsig
err分享
err收藏
err分享
err收藏
Binary and ternary logic-in-memory using nanosheet feedback field-effect transistors with triple-gated structure
err2024-03-18
err4
errOAAI
errHan, Jongseong; Son, Jaemin; Ryu, Seungho; Cho, Kyoungah; Kim, Sangsig
err分享
err收藏
err分享
err收藏
Universal logic-in-memory cell enabling all basic Boolean algebra logic
err2022-11-22
err5
errOAAI
errBaek, Eunwoo; Cho, Kyoungah; Kim, Sangsig
err分享
err收藏
err分享
err收藏
Bias-stress stability of top-gate coplanar a-ITGZO TFTs with HfO2 and HfAlO gate dielectrics
err2022-06-01
err12
PREAI
errKong, Heesung; Cho, Kyoungah; Lee, Hosang; Lee, Seungjun; Lim, Junhyung; Kim, Sangsig
err分享
err收藏