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S

Sheng‐Tsaing Tseng

National Tsing Hua University

27H指数
86论文数
3.2K被引数
收录论文 14
发表时间
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PL-EWMA controller to mitigate transition effects in high-mixed semiconductor production mode for stability enhancementPL-EWMA控制器用于缓解高混半导体生产模式中的过渡效应，以增强稳定性。
errInternational Journal of Production Research
IF7.3
err2025-08-04
err0
errOAAI
errHung-Ping Tung; Marzieh Khakifirooz; Shui-Pin Lee; David Shan-Hill Wong; Sheng-Tsaing Tseng
err分享
err收藏
Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis
errRELIABILITY ENGINEERING & SYSTEM SAFETY
IF11
err2023-07-01
err4
PREAI
errKhakifirooz, Marzieh; Fathi, Michel; Lee, I-Chen; Tseng, Sheng-Tsaing
err分享
err收藏
End of performance prediction of lithium-ion batteries
errJOURNAL OF QUALITY TECHNOLOGY
IF2.2
err2019-01-18
err13
errOAAI
errWang, Yi-Fu; Tseng, Sheng-Tsaing; Lindqvist, Bo Henry; Tsui, Kwok-Leung
err分享
err收藏
Adaptive Warranty Prediction for Highly Reliable Products
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2015-09-01
err5
PREAI
errHsu, Nan-Jung; Tseng, Sheng-Tsaing; Chen, Ming-Wei
err分享
err收藏
Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models基于Skew-Wiener线性退化模型的统计寿命推断
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2013-06-01
err77
PREAI
errPeng, Chien-Yu; Tseng, Sheng-Tsaing
err分享
err收藏
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2012-06-01
err160
errOAAI
errTsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan, Narayanaswamy
err分享
err收藏
Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2011-03-01
err67
PREAI
errTsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan, Narayanaswamy
err分享
err收藏
Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products高可靠性产品的渐进应力加速退化试验
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2010-03-01
err66
PREAI
errPeng, Chien-Yu; Tseng, Sheng-Tsaing
err分享
err收藏
Fault Detection Based on Statistical Multivariate Analysis and Microarray Visualization
errIEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
IF9.9
err2010-02-01
err61
PREAI
errMa, Ming-Da; Wong, David Shan-Hill; Jang, Shi-Shang; Tseng, Sheng-Tsaing
err分享
err收藏
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation ProcessesGamma退化过程的最优步进应力加速退化试验计划
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2009-12-01
err225
PREAI
errTseng, Sheng-Tsaing; Balakrishnan, Narayanaswamy; Tsai, Chih-Chun
err分享
err收藏
Mis-Specification Analysis of Linear Degradation Models
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2009-09-01
err381
PREAI
errPeng, Chien-Yu; Tseng, Sheng-Tsaing
err分享
err收藏
Optimal design for step-stress accelerated degradation tests步进应力加速退化试验的优化设计
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2006-03-01
err223
PREAI
errLiao, CM; Tseng, ST
err分享
err收藏
Optimal production run length for products sold with warranty
errEUROPEAN JOURNAL OF OPERATIONAL RESEARCH
IF6
err2000-02-01
err101
PREAI
errYeh, RH; Ho, WT; Tseng, ST
err分享
err收藏
Carryover effects in multi-attribute inspection
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err1999-09-01
err2
PREAI
errYeh, RH; Tseng, ST; Ho, WT
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
N
N. Balakrishnan
H 指数: 82 · 论文数: 1.5K
K
Kwok‐Leung Tsui
H 指数: 73 · 论文数: 592
D
David Shan‐Hill Wong
H 指数: 43 · 论文数: 250
B
Bo Henry Lindqvist
H 指数: 25 · 论文数: 130
R
Ruey Huei Yeh
H 指数: 23 · 论文数: 55
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