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Shuming Chen

national university of defense technology - china

21H指数
245论文数
1.6K被引数
收录论文 33
发表时间
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Comparison of D-flip-flops and D-latches: influence on SET susceptibility of the clock distribution network
errNUCLEAR SCIENCE AND TECHNIQUES
IF3.8
err2019-01-28
err2
PREAI
errHao, Pei-Pei; Chen, Shu-Ming
err分享
err收藏
A Specification-Based Semi-Formal Functional Verification Method by a Stage Transition Graph Model
errIEEE ACCESS
IF3.6
err2019-01-01
err1
errOAAI
errLv, Zhao; Chen, Shuming; Zhang, Tingrong; Wang, Yaohua
err分享
err收藏
The Evaluation of DCNN on Vector-SIMD DSP
errIEEE ACCESS
IF3.6
err2019-01-01
err8
errOAAI
errYang, Chao; Chen, Shuming; Wang, Yaohua; Zhang, Junyang
err分享
err收藏
A Novel DSP Architecture for Scientific Computing and Deep Learning
errIEEE ACCESS
IF3.6
err2019-01-01
err13
errOAAI
errYang, Chao; Chen, Shuming; Zhang, Jian; Lv, Zhao; Wang, Zhi
err分享
err收藏
High performance 33.7 GHz surface acoustic wave nanotransducers based on AlScN/diamond/Si layered structures
errAPPLIED PHYSICS LETTERS
IF3.6
err2018-08-28
err25
PREAI
errWang, Lei; Chen, Shuming; Zhang, Jinying; Zhou, Jian; Yang, Chengtao; Chen, Yiqin; Duan, Huigao
err分享
err收藏
Advancing CMOS-Type Ising Arithmetic Unit into the Domain of Real-World Applications
errIEEE TRANSACTIONS ON COMPUTERS
IF3.8
err2018-05-01
err17
PREAI
errZhang, Jian; Chen, Shuming; Wang, Yaohua
err分享
err收藏
Analysis of single-event transient sensitivity in fully depleted silicon-on-insulator MOSFETs
errNUCLEAR SCIENCE AND TECHNIQUES
IF3.8
err2018-03-13
err12
PREAI
errXu, Jing-Yan; Chen, Shu-Ming; Song, Rui-Qiang; Wu, Zhen-Yu; Chen, Jian-Jun
err分享
err收藏
Enhanced performance of 17.7 GHz SAW devices based on AlN/diamond/Si layered structure with embedded nanotransducer
errAPPLIED PHYSICS LETTERS
IF3.6
err2017-12-19
err26
PREAI
errWang, Lei; Chen, Shuming; Zhang, Jinying; Xiao, Dingbang; Han, Kaifeng; Ning, Xi; Liu, Jingtian; Chen, Zhe; Zhou, Jian
err分享
err收藏
Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2017-07-12
err1
PREAI
errHao, Peipei; Chen, Shuming; Huang, Pengcheng; Chen, Jianjun; Liang, Bin
err分享
err收藏
Experimental characterization of the dominant multiple nodes charge collection mechanism in metal oxide-semiconductor transistors
errAPPLIED PHYSICS LETTERS
IF3.6
err2017-06-09
err8
PREAI
errSong, Ruiqiang; Chen, Shuming; Chi, Yaqing; Wu, Zhenyu; Liang, Bin; Chen, Jianjun; Xu, Jingyan; Hao, Peipei; Yu, Junting
err分享
err收藏
Modeling the impact of process and operation variations on the soft error rate of digital circuits
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2017-02-24
err3
PREAI
errSong, Ruiqiang; Chen, Shuming; Liang, Bin; Chi, Yaqing; Chen, Jianjun
err分享
err收藏
Simulation analysis of heavy-ion-induced single-event response for nanoscale bulk-Si FinFETs and conventional planar devices
errSCIENCE CHINA-TECHNOLOGICAL SCIENCES
IF4.9
err2016-12-26
err5
PREAI
errYu, JunTing; Chen, ShuMing; Chen, JianJun; Huang, PengCheng
err分享
err收藏
A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2016-03-01
err27
PREAI
errDu, Yankang; Chen, Shuming
err分享
err收藏
Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology65nm体CMOS工艺中单事件双瞬态引起的单事件翻转及其阱结构依赖性
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2016-02-01
err4
PREAI
errHuang, Pengcheng; Chen, Shuming; Chen, Jianjun
err分享
err收藏
Investigation on the intense fringe formation phenomenon downstream hot-image plane
errOPTICS EXPRESS
IF3.3
err2015-11-18
err10
errOAAI
errHu, Yonghua; Li, Guohui; Zhang, Lifu; Huang, Wenti; Chen, Shuming
err分享
err收藏
Dielectric microwave properties of Si-integrated pulsed laser deposited (Ba, Sr)TiO3 thin films up to 110GHz
errAPPLIED PHYSICS LETTERS
IF3.6
err2015-08-06
err2
PREAI
errNing, Xi; Chen, Shuming; Zhang, Jinying; Huang, Hui; Wang, Lei
err分享
err收藏
Flip-flops soft error rate evaluation approach considering internal single-event transient
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2015-05-04
err11
PREAI
errSong RuiQiang; Chen ShuMing; He YiBai; Du YanKang
err分享
err收藏
Simulation study of N-hit SET variation in differential cascade voltage switch logical circuits
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2014-11-29
err3
PREAI
errHuang PengCheng; Chen ShuMing; Chen JianJun; Wu ZhenYu; Liang ZhengFa; Hu ChunMei; Liang Bin; Liu BiWei
err分享
err收藏
Design Optimization for Anharmonic Linear Surface-Electrode Ion Trap
errCHINESE PHYSICS LETTERS
IF4.2
err2014-11-11
err3
PREAI
errLiu Wei; Chen Shu-Ming; Chen Ping-Xing; Wu Wei
err分享
err收藏
Comparison of heavy-ion induced SEU for D-and TMR-flip-flop designs in 65-nm bulk CMOS technology
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2014-08-08
err6
PREAI
errHe YiBai; Chen ShuMing
err分享
err收藏

研究方向

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合作学者
合作期刊
刘玮 封面图
刘玮 (Wei Liu)
H 指数: 109 · 论文数: 1.6K
王
王雷 (Lei Wang)
H 指数: 70 · 论文数: 655
Z
Zheng Liu
H 指数: 51 · 论文数: 299
B
Bin Liang
H 指数: 48 · 论文数: 420
D
Dawei Li
H 指数: 48 · 论文数: 449
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