arrow
返回
S

Sungju Park

hanyang university

14H指数
162论文数
1.2K被引数
收录论文 17
发表时间
Highly Efficient Test Architecture for Low-Power AI Accelerators
err2022-08-01
err4
PREAI
errIbtesam, Muhammad; Solangi, Umair Saeed; Kim, Jinuk; Ansari, Muhammad Adil; Park, Sungju
err分享
err收藏
Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators
err2022-03-01
err3
PREAI
errIbtesam, Muhammad; Solangi, Umair Saeed; Kim, Jinuk; Ansari, Muhammad Adil; Park, Sungju
err分享
err收藏
Test Architecture for Systolic Array of Edge-Based AI Accelerator基于边缘的AI加速器脉动阵列的测试架构
err2021-01-01
err11
errOAAI
errSolangi, Umair Saeed; Ibtesam, Muhammad; Ansari, Muhammad Adil; Kim, Jinuk; Park, Sungju
err分享
err收藏
CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience
err2020-01-01
err0
errOAAI
errKim, Jinuk; Ibtesam, Muhammad; Kim, Dooyoung; Jung, Jihun; Park, Sungju
err分享
err收藏
Phase I Trial of Anti-MET Monoclonal Antibody in MET-Overexpressed Refractory Cancer
err2018-06-01
err19
PREAI
errLee, Jeeyun; Kim, Seung Tae; Park, Sungju; Lee, Sujin; Park, Se Hoon; Park, Joon Oh; Lim, Ho Yeong; Ahn, Hongmo; Bok, Haesook; Kim, Kyoung-Mee; Ahn, Myung Ju; Kang, Won Ki; Park, Young Suk
err分享
err收藏
Hard X-ray free-electron laser with femtosecond-scale timing jitter
err2017-10-31
err423
PREAI
errKang, Heung-Sik; Min, Chang-Ki; Heo, Hoon; Kim, Changbum; Yang, Haeryong; Kim, Gyujin; Nam, Inhyuk; Baek, Soung Youl; Choi, Hyo-Jin; Mun, Geonyeong; Park, Byoung Ryul; Suh, Young Jin; Shin, Dong Cheol; Hu, Jinyul; Hong, Juho; Jung, Seonghoon; Kim, Sang-Hee; Kim, KwangHoon; Na, Donghyun; Park, Soung Soo; Park, Yong Jung; Han, Jang-Hui; Jung, Young Gyu; Jeong, Seong Hun; Lee, Hong Gi; Lee, Sangbong; Lee, Sojeong; Lee, Woul-Woo; Oh, Bonggi; Suh, Hyung Suck; Parc, Yong Woon; Park, Sung-Ju; Kim, Min Ho; Jung, Nam-Suk; Kim, Young-Chan; Lee, Mong-Soo; Lee, Bong-Ho; Sung, Chi-Won; Mok, Ik-Su; Yang, Jung-Moo; Lee, Chae-Soon; Shin, Hocheol; Kim, Ji Hwa; Kim, Yongsam; Lee, Jae Hyuk; Park, Sang-Youn; Kim, Jangwoo; Park, Jaeku; Eom, Intae; Rah, Seungyu; Kim, Sunam; Nam, Ki Hyun; Park, Jaehyun; Park, Jaehun; Kim, Sangsoo; Kwon, Soonam; Park, Sang Han; Kim, Kyung Sook; Hyun, Hyojung; Kim, Seung Nam; Kim, Seonghan; Hwang, Sun-min; Kim, Myong Jin; Lim, Chae-yong; Yu, Chung-Jong; Kim, Bong-Soo; Kang, Tai-Hee; Kim, Kwang-Woo; Kim, Seung-Hwan; Lee, Hee-Seock; Lee, Heung-Soo; Park, Ki-Hyeon; Koo, Tae-Yeong; Kim, Dong-Eon; Ko, In Soo
err分享
err收藏
On Diagnosing the Aging Level of Automotive Semiconductor Devices
err2017-07-01
err4
PREAI
errJung, Jihun; Ansari, Muhammad Adil; Kim, Dooyoung; Yi, Hyunbean; Park, Sungju
err分享
err收藏
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory
err2014-08-01
err8
errOAAI
errAbbas, Syed Mohsin; Lee, Soonyoung; Baeg, Sanghyeon; Park, Sungju
err分享
err收藏
err分享
err收藏
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults
err2009-05-01
err2
PREAI
errSong, Jaehoon; Han, Juhee; Yi, Hyunbean; Jung, Taejin; Park, Sungju
err分享
err收藏
err分享
err收藏
err分享
err收藏
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults
err2009-01-01
err10
PREAI
errSong, Jaehoon; Han, Juhee; Yi, Hyunbean; Jung, Taejin; Park, Sungju
err分享
err收藏
err分享
err收藏