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Tom W. J. de Geus

Eindhoven University of Technology

14H指数
45论文数
702被引数
收录论文 10
发表时间
Stick-slip in a stack: How slip dissonance reveals aging
err2024-01-22
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errOAAI
errPoincloux, Samuel; Reis, Pedro M.; de Geus, Tom W. J.
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Finite strain FFT-based non-linear solvers made simple
err2017-05-01
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errde Geus, T. W. J.; Vondrejc, J.; Zeman, J.; Peerlings, R. H. J.; Geers, M. G. D.
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Fracture initiation in multi-phase materials: A systematic three-dimensional approach using a FFT-based solver
err2016-06-01
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errde Geus, T. W. J.; Cottura, M.; Appolaire, B.; Peerlings, R. H. J.; Geers, M. G. D.
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Systematic and objective identification of the microstructure around damage directly from images
err2016-03-01
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errde Geus, T. W. J.; Du, C.; Hoefnagels, J. P. M.; Peerlings, R. H. J.; Geers, M. G. D.
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