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Bulk and Interface effects on voltage linearity of ZrO2-SiO2 multilayered metal-insulator-metal capacitors for analog mixed-signal applications Park, S. D.; Park, C.; Gilmer, D. C.; Park, H. K.; Kang, C. Y.; Lim, K. Y.; Burham, C.; Barnett, J.; Kirsch, P. D.; Tseng, H. H.; Jammy, R.; Yeom, G. Y. 分享 收藏
Dipole model explaining high-k/metal gate field effect transistor threshold voltage tuning Kirsch, P. D.; Sivasubramani, P.; Huang, J.; Young, C. D.; Quevedo-Lopez, M. A.; Wen, H. C.; Alshareef, H.; Choi, K.; Park, C. S.; Freeman, K.; Hussain, M. M.; Bersuker, G.; Harris, H. R.; Majhi, P.; Choi, R.; Lysaght, P.; Lee, B. H.; Tseng, H. -H.; Jammy, R.; Boescke, T. S.; Lichtenwalner, D. J.; Jur, J. S.; Kingon, A. I. 分享 收藏
Molecular thin films: A new type of magnetic switch Heutz, Sandrine; Mitra, Chiranjib; Wu, Wei; Fisher, Andrew J.; Kerridge, Andrew; Stoneham, Marshall; Harker, Tony H.; Gardener, Julie; Tseng, Hsiang-Han; Jones, Tim S.; Renner, Christoph; Aeppli, Gabriel 分享 收藏
Higher permittivity rare earth doped HfO2 for sub-45-nm metal-insulator-semiconductor devices Govindarajan, S.; Boescke, T. S.; Sivasubramani, P.; Kirsch, P. D.; Lee, B. H.; Tseng, H.-H.; Jammy, R.; Schroeder, U.; Ramanathan, S.; Gnade, B. E. 分享 收藏
Thermal stability and electrical characterization of HfO2 films on thermally nitrided Si Bastos, KP; Morais, J; Miotti, L; Soares, GV; Pezzi, RP; da Silva, RCG; Boudinov, H; Baumvol, IJR; Hegde, RI; Tseng, HH; Tobinc, PJ 分享 收藏
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Compatibility of polycrystalline silicon gate deposition with HfO2 and Al2O3/HfO2 gate dielectrics Gilmer, DC; Hegde, R; Cotton, R; Garcia, R; Dhandapani, V; Triyoso, D; Roan, D; Franke, A; Rai, R; Prabhu, L; Hobbs, C; Grant, JM; La, L; Samavedam, S; Taylor, B; Tseng, H; Tobin, P 分享 收藏
Jet vapor deposition nitride processing and application to advanced CMOS devices for reduction of gate leakage current and boron penetration Tseng, HH; Veteran, J; Tobin, PJ; Mogab, J; Tsui, PGY; Wang, V; Khare, M; Wang, XW; Ma, TP; Hobbs, C; Hegde, R; Hartig, M; Kenig, G; Blumenthal, R; Cotton, R; Kaushik, V; Tamagawa, T; Halpern, BL; Cui, GJ; Schmitt, JJ 分享 收藏