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H

H.‐H. Tseng

texas state university san marcos

26H指数
88论文数
2.6K被引数
收录论文 14
发表时间
GeSn-based p-i-n photodiodes with strained active layer on a Si wafer
err2013-12-04
err146
PREAI
errTseng, H. H.; Li, H.; Mashanov, V.; Yang, Y. J.; Cheng, H. H.; Chang, G. E.; Soref, R. A.; Sun, G.
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Mid-infrared electroluminescence from a Ge/Ge0.922Sn0.078/Ge double heterostructure p-i-n diode on a Si substrate
err2013-05-09
err119
PREAI
errTseng, H. H.; Wu, K. Y.; Li, H.; Mashanov, V.; Cheng, H. H.; Sun, G.; Soref, R. A.
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Strain-enhanced photoluminescence from Ge direct transition
err2010-05-24
err91
PREAI
errCheng, T. -H.; Peng, K. -L.; Ko, C. -Y.; Chen, C. -Y.; Lan, H. -S.; Wu, Y. -R.; Liu, C. W.; Tseng, H. -H.
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Competitiveness between direct and indirect radiative transitions of Ge
err2010-03-04
err70
PREAI
errCheng, T. -H.; Ko, C. -Y.; Chen, C. -Y.; Peng, K. -L.; Luo, G. -L.; Liu, C. W.; Tseng, H. -H.
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Bulk and Interface effects on voltage linearity of ZrO2-SiO2 multilayered metal-insulator-metal capacitors for analog mixed-signal applications
err2009-07-16
err29
PREAI
errPark, S. D.; Park, C.; Gilmer, D. C.; Park, H. K.; Kang, C. Y.; Lim, K. Y.; Burham, C.; Barnett, J.; Kirsch, P. D.; Tseng, H. H.; Jammy, R.; Yeom, G. Y.
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Dipole model explaining high-k/metal gate field effect transistor threshold voltage tuning
err2008-03-04
err193
PREAI
errKirsch, P. D.; Sivasubramani, P.; Huang, J.; Young, C. D.; Quevedo-Lopez, M. A.; Wen, H. C.; Alshareef, H.; Choi, K.; Park, C. S.; Freeman, K.; Hussain, M. M.; Bersuker, G.; Harris, H. R.; Majhi, P.; Choi, R.; Lysaght, P.; Lee, B. H.; Tseng, H. -H.; Jammy, R.; Boescke, T. S.; Lichtenwalner, D. J.; Jur, J. S.; Kingon, A. I.
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Molecular thin films: A new type of magnetic switch
err2007-10-02
err143
errOAAI
errHeutz, Sandrine; Mitra, Chiranjib; Wu, Wei; Fisher, Andrew J.; Kerridge, Andrew; Stoneham, Marshall; Harker, Tony H.; Gardener, Julie; Tseng, Hsiang-Han; Jones, Tim S.; Renner, Christoph; Aeppli, Gabriel
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Higher permittivity rare earth doped HfO2 for sub-45-nm metal-insulator-semiconductor devices
err2007-08-07
err124
PREAI
errGovindarajan, S.; Boescke, T. S.; Sivasubramani, P.; Kirsch, P. D.; Lee, B. H.; Tseng, H.-H.; Jammy, R.; Schroeder, U.; Ramanathan, S.; Gnade, B. E.
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Thermal stability and electrical characterization of HfO2 films on thermally nitrided Si
err2004-01-01
err6
PREAI
errBastos, KP; Morais, J; Miotti, L; Soares, GV; Pezzi, RP; da Silva, RCG; Boudinov, H; Baumvol, IJR; Hegde, RI; Tseng, HH; Tobinc, PJ
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Oxygen reaction-diffusion in metalorganic chemical vapor deposition HfO2 films annealed in O2
err2002-08-26
err54
errOAAI
errBastos, KP; Morais, J; Miotti, L; Pezzi, RP; Soares, GV; Baumvol, IJR; Hegde, RI; Tseng, HH; Tobin, PJ
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Compatibility of polycrystalline silicon gate deposition with HfO2 and Al2O3/HfO2 gate dielectrics
err2002-08-12
err80
PREAI
errGilmer, DC; Hegde, R; Cotton, R; Garcia, R; Dhandapani, V; Triyoso, D; Roan, D; Franke, A; Rai, R; Prabhu, L; Hobbs, C; Grant, JM; La, L; Samavedam, S; Taylor, B; Tseng, H; Tobin, P
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Jet vapor deposition nitride processing and application to advanced CMOS devices for reduction of gate leakage current and boron penetration
err2000-06-01
err1
PREAI
errTseng, HH; Veteran, J; Tobin, PJ; Mogab, J; Tsui, PGY; Wang, V; Khare, M; Wang, XW; Ma, TP; Hobbs, C; Hegde, R; Hartig, M; Kenig, G; Blumenthal, R; Cotton, R; Kaushik, V; Tamagawa, T; Halpern, BL; Cui, GJ; Schmitt, JJ
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