Mark A. Lantz - Publications, H-index & Citations

Mark A. Lantz

international business machines (ibm)

35H指数

130论文数

5.3K被引数

收录论文 27

发表时间

Z-mag: A two-chart stereographic formulation for finite-element micromagnetic simulations Z-mag：一种用于有限元微磁仿真的双图立体图解公式

Computer Methods in Applied Mechanics and Engineering

IF7.3

2026-08-22

PREAI

Stella Brach; Federico Soldà; Kathrin Aebischer; Mark A. Lantz

Track-following system optimization for future magnetic tape data storage

MECHATRONICS

IF3.1

2021-12-01

PREAI

Ebermann, Patrick; Cherubini, Giovanni; Furrer, Simeon; Lantz, Mark A.; Pantazi, Angeliki

Feedback Control of Transport Systems in Tape Drives Without Tension Transducers (vol 49, pg 211, 2018)

MECHATRONICS

IF3.1

2018-10-01

PREAI

Cherubini, Giovanni; Pantazi, Angeliki; Lantz, Mark A.

Feedback control of transport systems in tape drives without tension transducers

MECHATRONICS

IF3.1

2018-02-01

PREAI

Cherubini, Giovanni; Pantazi, Angeliki; Lantz, Mark A.

Mechanics of lateral positioning of a translating tape due to tilted rollers: Theory and experiments

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES

IF3.8

2015-08-01

OAAI

Yang, Hankang; Engelen, Johan B. C.; Pantazi, Angeliki; Haeberle, Walter; Lantz, Mark A.; Mueftue, Sinan

β-Relaxation of PMMA: Tip Size and Stress Effects in Friction Force Microscopy

LANGMUIR

IF3.9

2015-05-07

PREAI

Sondhauss, Johannes; Lantz, Mark; Gotsmann, Bernd; Schirmeisen, Andre

Frictional Dissipation in a Polymer Bilayer System

LANGMUIR

IF3.9

2014-02-03

PREAI

Jansen, Lars; Lantz, Mark A.; Knoll, Armin W.; Schirmeisen, Andre; Gotsmann, Bernd

Quantized thermal transport across contacts of rough surfaces

NATURE MATERIALS

IF38.5

2012-10-21

124

PREAI

Gotsmann, B.; Lantz, M. A.

Servo-Pattern Design and Track-Following Control for Nanometer Head Positioning on Flexible Tape Media

IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY

IF3.9

2012-03-01

PREAI

Lantz, Mark A.; Cherubini, Giovanni; Pantazi, Angeliki; Jelitto, Jens

Wear-Resistant Nanoscale Silicon Carbide Tips for Scanning Probe Applications

ADVANCED FUNCTIONAL MATERIALS

IF19

2012-02-08

PREAI

Lantz, Mark A.; Gotsmann, Bernd; Jaroenapibal, Papot; Jacobs, Tevis D. B.; O'Connor, Sean D.; Sridharan, Kumar; Carpick, Robert W.

Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon

NATURE NANOTECHNOLOGY

IF34.9

2010-01-31

235

PREAI

Bhaskaran, Harish; Gotsmann, Bernd; Sebastian, Abu; Drechsler, Ute; Lantz, Mark A.; Despont, Michel; Jaroenapibal, Papot; Carpick, Robert W.; Chen, Yun; Sridharan, Kumar

Dynamic superlubricity and the elimination of wear on the nanoscale

NATURE NANOTECHNOLOGY

IF34.9

2009-08-02

108

PREAI

Lantz, Mark A.; Wiesmann, Dorothea; Gotsmann, Bernd

Site-specific force-distance characteristics on NaCl(001):: Measurements versus atomistic simulations (vol 74, art no 245426, 2006)

PHYSICAL REVIEW B

IF3.7

2008-07-17

OAAI

Lantz, M. A.; Hoffmann, R.; Foster, A. S.; Baratoff, A.; Hug, H. J.; Guentherodt, H.-J.

High resolution vacuum scanning thermal microscopy of HfO2 and SiO2

APPLIED PHYSICS LETTERS

IF3.6

2008-01-31

PREAI

Hinz, M.; Marti, O.; Gotsmann, B.; Lantz, M. A.; Duerig, U.

Control, of MEMS-based scanning-probe data-storage devices

IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY

IF3.9

2007-09-01

PREAI

Pantazi, Angeliki; Sebastian, Abu; Cherubini, Giovanni; Lantz, Mark; Pozidis, Haralampos; Rothuizen, Hugo; Eleftheriou, Evangelos

Site-specific force-distance characteristics on NaCl(001):: Measurements versus atomistic simulations

PHYSICAL REVIEW B

IF3.7

2006-12-22

OAAI

Lantz, M. A.; Hoffmann, R.; Foster, A. S.; Baratoff, A.; Hug, H. J.; Hidber, H. R.; Guentherodt, H.-J.

Carbon nanotube tips for thermomechanical data storage

APPLIED PHYSICS LETTERS

IF3.6

2003-08-11

PREAI

Lantz, MA; Gotsmann, B; Dürig, UT; Vettiger, P; Nakayama, Y; Shimizu, T; Tokumoto, H

Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111)7X7 surface -: art. no. 035324

PHYSICAL REVIEW B

IF3.7

2003-07-25

PREAI

Lantz, MA; Hug, HJ; Hoffmann, R; Martin, S; Baratoff, A; Güntherodt, HJ

Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy -: art. no. 085402

PHYSICAL REVIEW B

IF3.7

2003-02-05

PREAI

Hoffmann, R; Lantz, MA; Hug, HJ; van Schendel, PJA; Kappenberger, P; Martin, S; Baratoff, A; Güntherodt, HJ

Atomic resolution imaging and force versus distance measurements on KBr (001) using low temperature scanning force microscopy 使用低温扫描力显微镜对KBr (001) 进行原子分辨率成像和力与距离测量

APPLIED SURFACE SCIENCE

IF6.9

2002-03-01

PREAI

Hoffmann, R; Lantz, MA; Hug, HJ; van Schendel, PJA; Kappenberger, P; Martin, S; Baratoff, A; Güntherodt, HJ

研究方向