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收藏Exploring Structure Diversity in Atomic Resolution Microscopy With Graph用图形探索原子分辨显微镜中的结构多样性
Luo, Z; Feng, M; Gao, ZJ; Yu, JY; Chen, C; Hu, L; Wang, T; Xue, SA; Zhou, S; Ouyang, FP; Feng, DW; Wang, HM; Xu, KL; Zhang, J; Wang, SS
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收藏Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
Minj, Albert; Geens, Karen; Liang, Hu; Han, Han; Noel, Celine; Bakeroot, Benoit; Paredis, Kristof; Zhao, Ming; Hantschel, Thomas; Decoutere, Stefaan
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收藏Observation of Surface Dirac Cone in High-Quality Ultrathin Epitaxial Bi2Se3 Topological Insulator on AlN(0001) DielectricAlN(0001) 介质上高质量超薄外延Bi2Se3拓扑绝缘体中表面狄拉克锥的观察
Tsipas, Polychronis; Xenogiannopoulou, Evangelia; Kassavetis, Spyridon; Tsoutsou, Dimitra; Golias, Evangelos; Bazioti, Calliope; Dimitrakopulos, George P.; Komninou, Philomela; Liang, Hu; Caymax, Matty; Dimoulas, Athanasios
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