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D

D. N. Bose

xlri -xavier school of management

24H指数
261论文数
2.4K被引数
收录论文 15
发表时间
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Supplier Capability Signaling Through Investment in Quality Improvement: Roles of Cost of Quality and Inequity Aversion通过质量改进投资传递供应商能力信号：质量成本和不平等规避的作用
errDecision Analysis
IF0
err2026-01-01
err0
PREAI
errBose, Dipankar; Sarkar, Sumit
err分享
err收藏
Economic production lot sizing under imperfect quality, on-line inspection, and inspection errors: Full vs. sampling inspection
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2021-10-01
err20
PREAI
errBose, Dipankar; Guha, Apratim
err分享
err收藏
A note on Economic production quantity in batch manufacturing with imperfect quality, imperfect inspection, and destructive and non-destructive acceptance sampling in a two-tier market
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2020-08-01
err8
PREAI
errGuha, Apratim; Bose, Dipankar
err分享
err收藏
Assessment of residential institute foodservice using Kano categorization and importance-performance analysis使用Kano分类和重要性绩效分析对住宅机构的餐饮服务进行评估
errTQM JOURNAL
IF4.4
err2020-05-05
err12
PREAI
errRoy, Aayush Singha; Bose, Dipankar; Bera, U. K.
err分享
err收藏
Fabrication and characterization of GaAs MIS devices with N-rich PECVD SixNy dielectric
errAPPLIED SURFACE SCIENCE
IF6.9
err2001-09-01
err29
PREAI
errPal, S; Bose, DN
err分享
err收藏
Photoconductivity, low-temperature conductivity, and magnetoresistance studies on the layered semiconductor GaTe
errPHYSICAL REVIEW B
IF3.7
err2001-05-31
err33
PREAI
errBose, DN; Pal, S
err分享
err收藏
Study of aluminum and gold as the gate electrode material on silicon nitride based MIS devices
errAPPLIED SURFACE SCIENCE
IF6.9
err2001-02-01
err7
PREAI
errBose, M; Basa, DK; Bose, DN
err分享
err收藏
Study of nitrous oxide plasma oxidation of silicon nitride thin films
errAPPLIED SURFACE SCIENCE
IF6.9
err2000-05-01
err10
PREAI
errBose, M; Basa, DK; Bose, DN
err分享
err收藏
Determination of well widths in a MOVPE-grown InGaAs/InP multi-quantum well structure using SIMS and photoluminescence使用SIMS和光致发光确定MOVPE生长的InGaAs/InP多量子阱结构中的阱宽度
errAPPLIED SURFACE SCIENCE
IF6.9
err2000-05-01
err14
PREAI
errBose, DN; Banerji, P; Bhunia, S; Aparna, Y; Chhetri, MB; Chakraborty, BR
err分享
err收藏
Neural network modeling of PECVD silicon nitride films
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err1999-04-01
err22
PREAI
errGhosh, S; Dutta, PK; Bose, DN
err分享
err收藏
Effective techniques for reduction of silicon impurity in chloride vapor phase epitaxial growth of GaInAs
errMATERIALS RESEARCH BULLETIN
IF5.7
err1998-02-01
err0
PREAI
errPal, R; Dhaul, A; Agarwal, SK; Pal, D; Bose, DN
err分享
err收藏
Double crystal X-ray diffraction studies on chloride-VPE grown GaXIn1-XAs layers with different Ga-to-In ratio
errMATERIALS RESEARCH BULLETIN
IF5.7
err1997-05-01
err3
PREAI
errPal, R; Agarwal, SK; Pal, D; Bose, DN
err分享
err收藏
Strong photoluminescence in ammonia plasma treated amorphous-SiC thin films deposited by laser ablation
errAPPLIED PHYSICS LETTERS
IF3.6
err1996-05-20
err17
errOAAI
errGhosh, S; Bhattacharya, P; Bose, DN
err分享
err收藏
Ruthenium and sulphide passivation of GaAs
errAPPLIED SURFACE SCIENCE
IF6.9
err1996-01-01
err13
PREAI
errAli, ST; Ghosh, S; Bose, DN
err分享
err收藏
ELECTRONIC CONDUCTIVITY OF AGI USING DC POLARIZATION AND CHARGE-TRANSFER TECHNIQUES
errJOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
IF4.9
err1982-01-01
err17
PREAI
errMAZUMDAR, D; GOVINDACHARYULU, PA; BOSE, DN
err分享
err收藏

研究方向

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合作学者
合作期刊
P
P. Banerji
H 指数: 31 · 论文数: 214
D
Dipanjan Mazumdar
H 指数: 29 · 论文数: 139
S
Sandip Ghosh
H 指数: 24 · 论文数: 203
U
Uttam Kumar Bera
H 指数: 23 · 论文数: 134
S
Sumit Sarkar
H 指数: 16 · 论文数: 108
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