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收藏Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices
Cai, ZH; Rodrigues, W; Ilinski, P; Legnini, D; Lai, B; Yun, W; Isaacs, ED; Lutterodt, KE; Grenko, J; Glew, R; Sputz, S; Vandenberg, J; People, R; Alam, MA; Hybertsen, M; Ketelsen, LJP
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收藏Simulation and characterization of the selective area growth process
Alam, MA; People, R; Isaacs, E; Kim, CY; Evans-Lutterodt, K; Siegrist, T; Pernell, TL; Vandenberg, J; Sputz, SK; Chu, SNG; Lang, DV; Smith, L; Hybertsen, MS
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