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J. Misiewicz

wroclaw university of science & technology

39H指数
700论文数
8.2K被引数
收录论文 187
发表时间
Critical dimension metrology using Raman spectroscopy
err2020-07-27
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PREAI
errGawlik, Andrzej; Bogdanowicz, Janusz; Nuytten, Thomas; Charley, Anne-Laure; Teugels, Lieve; Misiewicz, Jan; Vandervorst, Wilfried
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Sensitivity of N-polar GaN surface barrier to ambient gases (vol 281, pg 561, 2019)N极性GaN表面势垒对环境气体的敏感性 (体积281,pg 561,2019)
err2020-04-01
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PREAI
errJanicki, Lukasz; Misiewicz, Jan; Siekacz, Marcin; Turski, Henryk; Moneta, Joanna; Gorantla, Sandeep; Skierbiszewski, Czeslaw; Kudrawiec, Robert
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Size-dependent optical properties of periodic arrays of semiconducting nanolines
err2020-02-21
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errOAAI
errGawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Morin, Pierre; Misiewicz, Jan; Vandervorst, Wilfried
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Sensitivity of N-polar GaN surface barrier to ambient gasesN极性GaN表面势垒对环境气体的敏感性
err2019-02-01
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errOAAI
errJanicki, Lukasz; Misiewicz, Jan; Siekacz, Marcin; Turski, Henryk; Moneta, Joanna; Gorantla, Sandeep; Skierbiszewski, Czeslaw; Kudrawiec, Robert
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Enhanced light coupling into periodic arrays of nanoscale semiconducting fins
err2018-08-07
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PREAI
errGawlik, Andrzej; Bogdanowicz, Janusz; Schulze, Andreas; Nuytten, Thomas; Tarnowski, Karol; Misiewicz, Jan; Vandervorst, Wilfried
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Carrier relaxation bottleneck in type-II InAs/InGaAlAs/InP(001) coupled quantum dots-quantum well structure emitting at 1.55 μm
err2018-05-29
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PREAI
errSyperek, M.; Andrzejewski, J.; Rogowicz, E.; Misiewicz, J.; Bauer, S.; Sichkovskyi, V. I.; Reithmaier, J. P.; Sek, G.
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Photonic engineering of highly linearly polarized quantum dot emission at telecommunication wavelengths
err2018-04-20
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PREAI
errMrowinski, P.; Emmerling, M.; Schneider, C.; Reithmaier, J. P.; Misiewicz, J.; Hoefling, S.; Sek, G.
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Exciton lifetime and emission polarization dispersion in strongly in-plane asymmetric nanostructures
err2017-12-27
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errOAAI
errGawelczyk, M.; Syperek, M.; Marynski, A.; Mrowinski, P.; Dusanowski, L.; Gawarecki, K.; Misiewicz, J.; Somers, A.; Reithmaier, J. P.; Hofling, S.; Sek, G.
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Confinement regime in self-assembled InAs/InAlGaAs/InP quantum dashes determined from exciton and biexciton recombination kinetics
err2017-12-20
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errOAAI
errDusanowski, L.; Mrowinski, P.; Syperek, M.; Misiewicz, J.; Somers, A.; Hoefling, S.; Reithmaier, J. P.; Sek, G.
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Triggered high-purity telecom-wavelength single-photon generation from p-shell-driven InGaAs/GaAs quantum dot
err2017-11-29
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errOAAI
errDusanowski, L.; Holewa, P.; Marynski, A.; Musial, A.; Heuser, T.; Srocka, N.; Quandt, D.; Strittmatter, A.; Rodt, S.; Misiewicz, J.; Reitzenstein, S.; Sek, G.
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Influence of europium on structure modification of TiO2 thin films prepared by high energy magnetron sputtering process
err2017-06-01
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PREAI
errWojcieszak, Damian; Mazur, Michal; Gibson, Des; Zatryb, Grzegorz; Kaczmarek, Danuta; Misiewicz, Jan
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Lateral carrier diffusion in InGaAs/GaAs coupled quantum dot-quantum well system
err2017-05-31
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PREAI
errPieczarka, M.; Syperek, M.; Bieganska, D.; Gilfert, C.; Pavelescu, E. M.; Reithmaier, J. P.; Misiewicz, J.; Sek, G.
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Contactless electroreflectance studies of the Fermi level position at the air/GaN interface: Bistable nature of the Ga-polar surface
err2017-02-01
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PREAI
errJanicki, Lukasz; Gladysiewicz, Marta; Misiewicz, Jan; Klosek, Kamil; Sobanska, Marta; Kempisty, Pawel; Zytkiewicz, Zbigniew R.; Kudrawiec, Robert
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Exciton spin relaxation in InAs/InGaAlAs/InP(001) quantum dashes emitting near 1.55μm
err2016-11-08
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errOAAI
errSyperek, M.; Dusanowski, L.; Gawelczyk, M.; Sek, G.; Somers, A.; Reithmaier, J. P.; Hoefling, S.; Misiewicz, J.
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Excitonic fine structure and binding energies of excitonic complexes in single InAs quantum dashes
err2016-09-26
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errOAAI
errMrowinski, P.; Zielinski, M.; Swiderski, M.; Misiewicz, J.; Somers, A.; Reithmaier, J. P.; Hoefling, S.; Sek, G.
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Photoluminescence quenching mechanisms in type II InAs/GaInSb QWs on InAs substrates
err2016-07-28
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errOAAI
errDyksik, M.; Motyka, M.; Kurka, M.; Ryczko, K.; Dallner, M.; Hoefling, S.; Kamp, M.; Sek, G.; Misiewicz, J.
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Engineering of electric field distribution in GaN(cap)/AlGaN/GaN heterostructures: theoretical and experimental studies
err2016-07-28
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PREAI
errGladysiewicz, M.; Janicki, L.; Misiewicz, J.; Sobanska, M.; Klosek, K.; Zytkiewicz, Z. R.; Kudrawiec, R.
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Non-destructive carrier concentration determination in InAs thin films for THz radiation generating devices using fast differential reflectance spectroscopy
err2016-07-18
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errOAAI
errKozub, Michal A.; Motyka, Marcin; Dyksik, Mateusz; Sek, Grzegorz; Misiewicz, Jan; Nishisaka, Kazuichi; Maemoto, Toshihiko; Sasa, Shigehiko
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