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M

Mohammed H. Modi

Raja Ramanna Centre for Advanced Technology

17H指数
130论文数
815被引数
收录论文 20
发表时间
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Effect of Adatom Energy on the Interfacial and Surface Morphology of Pulsed DC Sputtered Ruthenium Thin Films脉冲直流溅射钌薄膜界面和表面形貌受吸附原子能量的影响
errSurface and Interface Analysis
IF1.8
err2026-02-01
err0
errOAAI
errGupta, Shruti; Mukherjee, C.; Kamparath, R.; Bose, A.; Yadav, P. k.; Gupta, R. k.; Modi, Mohammed h.
err分享
err收藏
Coordinately unsaturated single Fe-atoms with N vacancies and enhanced sp3 carbon defects in Fe-N(sp2)-C structural units for suppression of cancer cell metabolism and electrochemical oxygen evolution
errNANOSCALE
IF5.1
err2024-01-01
err0
PREAI
errYadav, Anubha; Hiremath, Netra; Saini, Bhagirath; Matsagar, Babasaheb M.; Han, Po-Chun; Ujihara, Masaki; Modi, Mohammed Hussein; Wu, Kevin C. -W.; Sharma, Rakesh K.; Vankayala, Raviraj; Dutta, Saikat
err分享
err收藏
Boron migration during amorphous to crystalline transformation in CoFeB/MgO multilayers: A reflectivity study
errMATERIALS RESEARCH BULLETIN
IF5.7
err2023-05-01
err1
PREAI
errVishwakarma, Pramod; Sharma, Gagan; Modi, M. H.; Gupta, Mukul; Stahn, Jochen; Gupta, Ajay
err分享
err收藏
Interface asymmetry in AlN/Ni and Ni/AlN interfaces: A study using resonant soft X-ray reflectivity
errAPPLIED SURFACE SCIENCE
IF6.9
err2020-11-01
err8
PREAI
errKiranjot; Dhawan, R.; Gupta, R. K.; Yadav, P. K.; Modi, Mohammed H.
err分享
err收藏
Interface evolution of Cr/Ti multilayer films during continuous to discontinuous transition of Cr layer
errVACUUM
IF3.9
err2020-11-01
err12
PREAI
errSarkar, P.; Biswas, A.; Rai, S.; Srivastava, H.; Mandal, S.; Modi, M. H.; Bhattacharyya, D.
err分享
err收藏
Study of soft x-ray optical properties of niobium carbide (NbC) thin film in 6-15 nm wavelength region碳化铌 (NbC) 薄膜在6-15 nm波长范围内的软x射线光学特性研究
errVACUUM
IF3.9
err2018-09-01
err1
PREAI
errSingh, Amol; Sinha, Mangalika; Modi, Mohammed H.
err分享
err收藏
Investigation on depth resolved compositions of e-beam deposited ZrO2 thin film
errAPPLIED SURFACE SCIENCE
IF6.9
err2017-10-01
err5
PREAI
errSingh, Amol; Sinha, Mangalika; Gupta, R. K.; Modi, Mohammed H.
err分享
err收藏
Depth resolved compositional analysis of aluminium oxide thin film using non-destructive soft x-ray reflectivity technique
errAPPLIED SURFACE SCIENCE
IF6.9
err2017-10-01
err5
PREAI
errSinha, Mangalika; Modi, Mohammed H.
err分享
err收藏
Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications通过离子束溅射沉积的碳化锆 (ZrC) 薄膜的结构和光学性质的研究，用于软x射线光学应用
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2015-06-01
err12
PREAI
errSingh, Amol; Modi, Mohammed H.; Sinha, A. K.; Dhawan, Rajnish; Lodha, G. S.
err分享
err收藏
Study of growth kinetics and depth resolved composition of a-SiNx: H thin films by resonant soft X-ray reflectivity at the Si L2,3-edge
errAPPLIED SURFACE SCIENCE
IF6.9
err2014-06-01
err4
PREAI
errBommali, R. K.; Modi, M. H.; Zhou, S.; Ghosh, S.; Srivastava, P.
err分享
err收藏
Cleaning of carbon layer from the gold films using a pulsed Nd:YAG laser
errAPPLIED SURFACE SCIENCE
IF6.9
err2013-10-01
err26
PREAI
errSingh, Amol; Choubey, Ambar; Modi, Mohammed H.; Upadhyaya, B. N.; Oak, S. M.; Lodha, G. S.; Deb, S. K.
err分享
err收藏
NbC/Si multilayer mirror for next generation EUV light sources
errOPTICS EXPRESS
IF3.3
err2012-06-20
err23
errOAAI
errModi, Mohammed H.; Rai, S. K.; Idir, Mourad; Schaefers, F.; Lodha, G. S.
err分享
err收藏
X-ray optics simulation using Gaussian superposition technique
errOPTICS EXPRESS
IF3.3
err2011-09-15
err7
errOAAI
errIdir, Mourad; Cywiak, Moises; Morales, Arquimedes; Modi, Mohammed H.
err分享
err收藏
Study of the optical response of Si-rich a-SiNx:H thin film near Si L2,3-edge using soft x-ray reflectivity
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2011-05-06
err0
PREAI
errSingh, Sarab Preet; Modi, Mohammed H.; Srivastava, P.
err分享
err收藏
Growth kinetics and compositional analysis of silicon rich a-SiNx : H film: A soft x-ray reflectivity study
errAPPLIED PHYSICS LETTERS
IF3.6
err2010-10-12
err21
PREAI
errSingh, Sarab Preet; Modi, Mohammed H.; Srivastava, P.
err分享
err收藏
Network compaction and surface deformation in the hydrogenated silicon nitride film upon soft x-ray/VUV illumination (vol 74, art no 045326, 2006)
errPHYSICAL REVIEW B
IF3.7
err2006-08-04
err0
errOAAI
errModi, Mohammed H.; Lodha, G. S.; Srivastava, P.; Sinha, A. K.; Nandedkar, R. V.
err分享
err收藏
Network compaction and surface deformation in the hydrogenated silicon nitride film upon soft x-ray/VUV illumination
errPHYSICAL REVIEW B
IF3.7
err2006-07-26
err9
PREAI
errModi, Mohammed H.; Lodha, G. S.; Srivastava, P.; Sinha, A. K.; Nandedkar, R. V.
err分享
err收藏
Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrate
errPHYSICAL REVIEW B
IF3.7
err2006-01-10
err19
errOAAI
errRai, S; Tiwari, MK; Lodha, GS; Modi, MH; Chattopadhyay, MK; Majumdar, S; Gardelis, S; Viskadourakis, Z; Giapintzakis, J; Nandedkar, RV; Roy, SB; Chaddah, P
err分享
err收藏
Non-destructive surface characterization of float glass: X-ray reflectivity and grazing incidence X-ray fluorescence analysis
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err2005-08-01
err5
PREAI
errTiwari, MK; Modi, MH; Lodha, GS; Sinha, AK; Sawhney, KJS; Nandedkar, RV
err分享
err收藏
X-ray multilayer optics: growth and characterizationX射线多层光学器件: 生长与表征
errVACUUM
IF3.9
err2001-03-01
err6
PREAI
errLodha, GS; Raghuvanshi, VK; Modi, MH; Tripathi, P; Verma, A; Nandedkar, RV
err分享
err收藏

研究方向

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合作学者
合作期刊
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Kevin C.‐W. Wu
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H 指数: 53 · 论文数: 616
A
A. Chandra Bose
H 指数: 51 · 论文数: 229
S
Saikat Dutta
H 指数: 44 · 论文数: 160
P
P. Chaddah
H 指数: 36 · 论文数: 311
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