J. Bläsing - Publications, H-index & Citations

J. Bläsing

Otto von Guericke University

42H指数

221论文数

7.5K被引数

收录论文 44

发表时间

Defect characterization of heavy-ion irradiated AlInN/GaN on Si high-electron-mobility transistors

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2021-12-20

OAAI

Challa, S. R.; Witte, H.; Schmidt, G.; Blaesing, J.; Vega, N.; Kristukat, C.; Muller, N. A.; Debray, M. E.; Christen, J.; Dadgar, A.; Strittmatter, A.

Individually resolved luminescence from closely stacked GaN/AlN quantum wells

PHOTONICS RESEARCH

IF7.2

2020-04-01

PREAI

Sheng, Bowen; Schmidt, Gordon; Bertram, Frank; Veit, Peter; Wang, Yixin; Wang, Tao; Rong, Xin; Chen, Zhaoying; Wang, Ping; Blasing, Juergen; Miyake, Hideto; Li, Hongwei; Guo, Shiping; Qin, Zhixin; Strittmatter, Andre; Shen, Bo; Christen, Juergen; Wang, Xinqiang

Anisotropic Optical Properties of Metastable (01(1)over-bar2) α-Ga2O3 Grown by Plasma-Assisted Molecular Beam Epitaxy

PHYSICAL REVIEW APPLIED

IF4.4

2018-08-29

PREAI

Kracht, M.; Karg, A.; Feneberg, M.; Blaesing, J.; Schoermann, J.; Goldhahn, R.; Eickhoff, M.

Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction

APPLIED PHYSICS LETTERS

IF3.6

2017-03-20

PREAI

Holy, V.; Kriegner, D.; Lesnik, A.; Blaesing, J.; Wieneke, M.; Dadgar, A.; Harcuba, P.

All metalorganic chemical vapor phase epitaxy of p/n-GaN tunnel junction for blue light emitting diode applications

APPLIED PHYSICS LETTERS

IF3.6

2017-03-09

PREAI

Neugebauer, S.; Hoffmann, M. P.; Witte, H.; Blaesing, J.; Dadgar, A.; Strittmatter, A.; Niermann, T.; Narodovitch, M.; Lehmann, M.

On reduction of current leakage in GaN by carbon-doping

APPLIED PHYSICS LETTERS

IF3.6

2016-11-22

PREAI

Fariza, Aqdas; Lesnik, Andreas; Blasing, Jurgen; Hoffmann, Marc P.; Horich, Florian; Veit, Peter; Witte, Hartmut; Dadgar, Armin; Strittmatter, Andre

Green to blue polarization compensated c-axis oriented multi-quantum wells by AlGaInN barrier layers

APPLIED PHYSICS LETTERS

IF3.6

2013-02-15

PREAI

Dadgar, A.; Groh, L.; Metzner, S.; Neugebauer, S.; Blaesing, J.; Hempel, T.; Bertram, F.; Christen, J.; Krost, A.; Andreev, Z.; Witzigmann, B.

Luminescence from two-dimensional electron gases in InAlN/GaN heterostructures with different In content

APPLIED PHYSICS LETTERS

IF3.6

2012-05-21

OAAI

Romero, M. F.; Feneberg, M.; Moser, P.; Berger, C.; Blaesing, J.; Dadgar, A.; Krost, A.; Sakalauskas, E.; Goldhahn, R.

High Si and Ge n-type doping of GaN doping - Limits and impact on stress

APPLIED PHYSICS LETTERS

IF3.6

2012-03-19

182

PREAI

Fritze, S.; Dadgar, A.; Witte, H.; Buegler, M.; Rohrbeck, A.; Blaesing, J.; Hoffmann, A.; Krost, A.

Strain evaluation in AlInN/GaN Bragg mirrors by in situ curvature measurements and ex situ x-ray grazing incidence and transmission scattering

APPLIED PHYSICS LETTERS

IF3.6

2010-11-03

PREAI

Krost, A.; Berger, C.; Blaesing, J.; Franke, A.; Hempel, T.; Dadgar, A.; Christen, J.

Strain profiling of AlInN/GaN distributed Bragg reflectors using in situ curvature measurements and ex situ X-ray diffraction

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

IF7

2010-11-01

PREAI

Berger, C.; Moser, P.; Dadgar, A.; Blasing, J.; Clos, R.; Krost, A.

Dielectric function and optical properties of Al-rich AlInN alloys pseudomorphically grown on GaN

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2010-08-24

OAAI

Sakalauskas, E.; Behmenburg, H.; Hums, C.; Schley, P.; Rossbach, G.; Giesen, C.; Heuken, M.; Kalisch, H.; Jansen, R. H.; Blaesing, J.; Dadgar, A.; Krost, A.; Goldhahn, R.

Direct microscopic correlation of crystal orientation and luminescence in spontaneously formed nonpolar and semipolar GaN growth domains

APPLIED PHYSICS LETTERS

IF3.6

2010-04-26

PREAI

Bastek, B.; August, O.; Hempel, T.; Christen, J.; Wieneke, M.; Blaesing, J.; Dadgar, A.; Krost, A.; Wendt, U.

InGaN/GaN light-emitting diodes on Si(110) substrates grown by metal-organic vapour phase epitaxy

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2009-02-16

PREAI

Reiher, F.; Dadgar, A.; Blaesing, J.; Wieneke, M.; Mueller, M.; Franke, A.; Reissmann, L.; Christen, J.; Krost, A.