J. M. Gibson - Publications, H-index & Citations

J. M. Gibson

Helmholtz Association

64H指数

409论文数

1.8W被引数

收录论文 32

发表时间

Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of Noise 快速获取波动电子显微镜：去相干和噪声的主导作用

MICROSCOPY AND MICROANALYSIS

IF3

2025-06-01

PREAI

Zjajo, Armin; Du, Hongchu; Dunin-Borkowski, Rafal E.; Gibson, J. Murray; Rezikyan, Aram; Treacy, Michael M. J.

The limited role of surface defects as nucleation sites for Cu2O on Cu(001)

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2019-12-06

PREAI

Yang, JC; Yeadon, M; Kolasa, B; Gibson, JM

Effect of postoxidation annealing on Si/SiO2 interface roughness

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2019-12-06

PREAI

Chen, XD; Gibson, JM

Compression and Aggregation-Resistant Particles of Crumpled Soft Sheets

ACS NANO

IF16

2011-10-18

533

PREAI

Luo, Jiayan; Jang, Hee Dong; Sun, Tao; Xiao, Li; He, Zhen; Katsoulidis, Alexandros P.; Kanatzidis, Mercouri G.; Gibson, J. Murray; Huang, Jiaxing

The birth of the blues: how physics underlies music

REPORTS ON PROGRESS IN PHYSICS

IF20.7

2009-06-30

PREAI

Gibson, J. M.

Beam transit effects in single molecule coherent diffraction

PHYSICAL REVIEW B

IF3.7

2008-12-01

PREAI

Gibson, J. M.; Treacy, M. M. J.

Fluctuation microscopy studies of medium-range ordering in amorphous diamond-like carbon films

APPLIED PHYSICS LETTERS

IF3.6

2004-04-12

OAAI

Chen, XD; Sullivan, JP; Friedmann, TA; Gibson, JM

The oblate morphology of supported PtRu5 on carbon black

MATERIALS CHARACTERIZATION

IF5.5

2003-10-01

PREAI

Yang, JC; Bradley, S; Gibson, JM

Increasing medium-range order in amorphous silicon with low-energy ion bombardment

APPLIED PHYSICS LETTERS

IF3.6

2003-05-26

OAAI

Gerbi, JE; Voyles, PM; Treacy, MMJ; Gibson, JM; Abelson, JR

Morphology and electronic structure in nitrogen-doped ultrananocrystalline diamond

APPLIED PHYSICS LETTERS

IF3.6

2002-09-16

198

PREAI

Birrell, J; Carlisle, JA; Auciello, O; Gruen, DM; Gibson, JM

SURFACE DERIVATIZATION AND ISOLATION OF SEMICONDUCTOR CLUSTER MOLECULES

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

IF15.6

2002-05-01

893

OAAI

STEIGERWALD, ML; ALIVISATOS, AP; GIBSON, JM; HARRIS, TD; KORTAN, R; MULLER, AJ; THAYER, AM; DUNCAN, TM; DOUGLASS, DC; BRUS, LE

Increased medium-range order in amorphous silicon with increased substrate temperature

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2001-11-01

OAAI

Voyles, PM; Gerbi, JE; Treacy, MMJ; Gibson, JM; Abelson, JR

Burrowing of nanoparticles on clean metal substrates: Surface smoothing on a nanoscale

PHYSICAL REVIEW B

IF3.7

2001-08-08

PREAI

Zimmermann, CG; Nordlund, K; Yeadon, M; Gibson, JM; Averback, RS; Herr, U; Samwer, K

Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization

APPLIED PHYSICS LETTERS

IF3.6

2001-04-02

PREAI

Cabrillo, C; Bermejo, FJ; Gibson, JM; Johnson, JA; Faccio, D; Pruneri, V; Kazansky, PG

Evolution of coherent islands during strained-layer Volmer-Weber growth of Si on Ge(111)

PHYSICAL REVIEW B

IF3.7

2001-03-07

OAAI

Raviswaran, A; Liu, CP; Kim, J; Cahill, DG; Gibson, JM

Dome-to-pyramid shape transition in Ge/Si islands due to strain relaxation by interdiffusion

APPLIED PHYSICS LETTERS

IF3.6

2000-09-11

PREAI

Henstrom, WL; Liu, CP; Gibson, JM; Kamins, TI; Williams, RS

Schlafli cluster topological analysis of medium range order in paracrystalline amorphous semiconductor models

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2000-05-01

PREAI

Treacy, MMJ; Voyles, PM; Gibson, JM

Nucleation of single-crystal CoSi2 with oxide-mediated epitaxy

APPLIED PHYSICS LETTERS

IF3.6

1999-11-22

PREAI

Kleinschmit, MW; Yeadon, M; Gibson, JM

Direct measurement of strain in a Ge island on Si(001)

APPLIED PHYSICS LETTERS

IF3.6

1999-07-05

OAAI

Miller, PD; Liu, CP; Henstrom, WL; Gibson, JM; Huang, Y; Zhang, P; Kamins, TI; Basile, DP; Williams, RS

Method for detecting subtle spatial structures by fluctuation microscopy

PHYSICAL REVIEW B

IF3.7

1999-07-01

PREAI

Iwai, T; Voyles, PM; Gibson, JM; Oono, Y

研究方向