P. Petrík - Publications, H-index & Citations

P. Petrík

hun-ren

24H指数

290论文数

2.4K被引数

收录论文 72

发表时间

Towards Advanced Materials: Functional Perspectives of Co-Doped Zno Thin Films

Micromachines

IF3

2026-03-03

OAAI

Mariuca Gartner; Mariana Chelu; Anna Szekeres; Peter Petrik

A New Method of Evaluating Multi-Color Ellipsometric Mapping on Big-Area Samples 大尺寸样品多色椭偏术映射的新评价方法

SCI

IF0

2026-01-13

OAAI

Kalvin, Sandor; Zereay, Berhane Nugusse; Juhasz, Gyorgy; Major, Csaba; Petrik, Peter; Horvath, Zoltan Gyorgy; Fried, Miklos

Photoacoustic-Driven Retrieval of Complex Refractive Indices for Absorbing Aerosols

ANALYTICAL CHEMISTRY

IF6.7

2025-11-01

PREAI

Rahman, Abdul; Raza, Muhammad Haseeb; Hodovany, Szabolcs; Ashfaq, Rana Khawar; Shah, Jamshed Saeed; Nyerges, Boglarka; Petrik, Peter; Chong, Cheng Tung; Mehmood, Muhammad Qasim; Xiong, Jichuan; Szabo, Gabor; Bozoki, Zoltan; Ajtai, Tibor

Electrochromic Efficiency in AxB(1-x)Oy-Type Mixed Metal Oxide Alloys AxB(1-x)Oy型混合金属氧化物合金的电致变色效率

INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES

IF4.9

2025-04-10

OAAI

Labadi, Zoltan; Ismaeel, Noor Taha; Petrik, Peter; Fried, Miklos

Spectroscopic Ellipsometry of Plasmonic Gratings-Ideal Parameters for Sensing and Subpicometer Measurement Uncertainty

ACS OMEGA

IF4.3

2025-04-01

OAAI

Mukherjee, Deshabrato; Burger, Sven; Siefke, Thomas; Gour, Jeetendra; Bodermann, Bernd; Petrik, Peter

Optimized sensing on gold nanoparticles created by graded-layer magnetron sputtering and annealing

SENSORS AND ACTUATORS B-CHEMICAL

IF7.7

2025-02-01

OAAI

Mukherjee, Deshabrato; Kertesz, Krisztian; Zolnai, Zsolt; Kovacs, Zoltan; Deak, Andras; Palinkas, Andras; Osvath, Zoltan; Olasz, Daniel; Romanenko, Alekszej; Fried, Miklos; Burger, Sven; Safran, Gyorgy; Petrik, Peter

Influence of gamma radiation on self-assembled molecular layers developed on different metals

SURFACE & COATINGS TECHNOLOGY

IF6.1

2024-08-01

OAAI

Pfeifer, E. K.; Trif, L.; Petrik, P.; Mink, J.; Gyurika, I. G.; Telegdi, J.

Dielectric function and interband critical points of compressively strained ferroelectric K 0.85 Na 0.15 NbO 3 thin film with monoclinic and orthorhombic symmetry

OPTICS EXPRESS

IF3.3

2024-04-12

OAAI

Bin Anooz, Saud; Petrik, Peter; Wang, Yankun; Mukherjee, Deshabrato; Schmidbauer, Martin; Schwarzkopf, Jutta

In-situ spectral reflectance investigation of hetero-epitaxially grown β-Ga2O3 thin films on c-plane Al2O3 via MOVPE process

APPLIED SURFACE SCIENCE

IF6.9

2024-04-01

OAAI

Chou, Ta-Shun; Bin Anooz, Saud; Grueneberg, Raimund; Rehm, Jana; Akhtar, Arub; Mukherjee, Deshabrato; Petrik, Peter; Popp, Andreas

Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency

MATERIALS

IF3.2

2024-02-22

OAAI

Labadi, Zoltan; Takacs, Daniel; Zolnai, Zsolt; Petrik, Peter; Fried, Miklos

Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry 用原位光谱椭偏仪研究低碳钢彩色蚀刻过程中层发展的动力学

HELIYON

IF3.6

2024-02-01

OAAI

Renko, Jozsef Balint; Romanenko, Alekszej; Biro, Tamas; Szabo, Peter Janos; Petrik, Peter; Bonyar, Attila

Effect of process parameters on co-sputtered Al(1-x)ScxN layer's properties: Morphology, crystal structure, strain, band gap, and piezoelectricity

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2024-01-01

OAAI

Khanh, Nguyen Quoc; Horvath, Zsolt Endre; Zolnai, Zsolt; Petrik, Peter; Posa, Laszlo; Volk, Janos

Atomic structure and annealing-induced reordering of ε-Ga2O3: A Rutherford backscattering/channeling and spectroscopic ellipsometry study

APPLIED SURFACE SCIENCE

IF6.9

2023-11-01

OAAI

Zolnai, Z.; Petrik, P.; Nemeth, A.; Volk, J.; Bosi, M.; Seravalli, L.; Fornari, R.

Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models

MATERIALS

IF3.2

2023-06-06

OAAI

Ismaeel, Noor Taha; Labadi, Zoltan; Petrik, Peter; Fried, Miklos

Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases

MATERIALS

IF3.2

2023-04-10

OAAI

Safran, Gyoergy; Petrik, Peter; Szasz, Noemi; Olasz, Daniel; Chinh, Nguyen Quang; Serenyi, Miklos

Real-Time Ellipsometry at High and Low Temperatures

ACS OMEGA

IF4.3

2023-01-17

OAAI

Mukherjee, Deshabrato; Petrik, Peter

Scanning-resonance optical sensing based on a laterally graded plasmonic layer-optical properties of AgxAl1-x in the range of x=0 to 1

APPLIED SURFACE SCIENCE

IF6.9

2022-12-01

OAAI

Kalas, Benjamin; Safran, Gyorgy; Serenyi, Miklos; Fried, Miklos; Petrik, Peter

Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2022-12-01

OAAI

Lohner, Tivadar; Nemeth, Attila; Zolnai, Zsolt; Kalas, Benjamin; Romanenko, Alekszej; Nguyen Quoc Khanh; Szilagyi, Edit; Kotai, Endre; Agocs, Emil; Toth, Zsolt; Budai, Judit; Petrik, Peter; Fried, Miklos; Barsony, Istvan; Gyulai, Jozsef

The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials

NATURE COMMUNICATIONS

IF15.7

2022-11-09

OAAI

Palinkas, Andras; Kalvin, Gyorgy; Vancso, Peter; Kandrai, Konrad; Szendro, Marton; Nemeth, Gergely; Nemeth, Miklos; Pekker, Aron; Pap, Jozsef S.; Petrik, Peter; Kamaras, Katalin; Tapaszto, Levente; Nemes-Incze, Peter

Ultrasensitive probing of plasmonic hot electron occupancies

NATURE COMMUNICATIONS

IF15.7

2022-11-05

OAAI

Budai, Judit; Papa, Zsuzsanna; Petrik, Peter; Dombi, Peter

研究方向