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Claude Weisbuch

University of California System

65H指数
325论文数
1.8W被引数
收录论文 87
发表时间
Unexpected origin of the quantum efficiency reduction in long-wavelength (In, Ga)N light-emitting diodes
err2025-03-03
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PREAI
errTak, Tanay; Chow, Yi Chao; Nakamura, Shuji; Denbaars, Steven P.; Weisbuch, Claude; Speck, James S.
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Investigation of the cesium activation of GaN photocathodes by low-energy electron microscopy
err2024-09-03
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PREAI
errSauty, Mylene; Johnson, Cameron W.; Tak, Tanay; Ho, Wan Ying; Chow, Yi Chao; Speck, James S.; Schmid, Andreas K.; Weisbuch, Claude; Peretti, Jacques
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Injection mechanisms in a III-nitride light-emitting diode as seen by self-emissive electron microscopy
err2023-12-26
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errOAAI
errTak, Tanay; Johnson, Cameron W.; Ho, Wan Ying; Wu, Feng; Sauty, Mylene; Rebollo, Steve; Schmid, Andreas K.; Peretti, Jacques; Wu, Yuh-Renn; Weisbuch, Claude; Speck, James S.
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Carrier localization in III-nitride versus conventional III-V semiconductors: A study on the effects of alloy disorder using landscape theory and the Schrodinger equation
err2023-10-26
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errOAAI
errTsai, Tsung-Yin; Qwah, Kai Shek; Banon, Jean-Philippe; Filoche, Marcel; Weisbuch, Claude; Wu, Yuh-Renn; Speck, James S.
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Origins of the high-energy electroluminescence peaks in long-wavelength (∼495-685 nm) InGaN light-emitting diodes
err2023-08-28
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errOAAI
errChow, Yi Chao; Tak, Tanay; Wu, Feng; Ewing, Jacob; Nakamura, Shuji; Denbaars, Steven P.; Wu, Yuh-Renn; Weisbuch, Claude; Speck, James S.
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Steady-state junction current distribution in p-n GaN diodes measured using low-energy electron microscopy (LEEM)使用低能电子显微镜 (LEEM) 测量的p-n GaN二极管中的稳态结电流分布
err2023-07-17
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errOAAI
errHo, Wan Ying; Johnson, Cameron W.; Tak, Tanay; Sauty, Mylene; Chow, Yi Chao; Nakamura, Shuji; Schmid, Andreas; Peretti, Jacques; Weisbuch, Claude; Speck, James S.
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Dynamics of double-peak photoluminescence in m-plane InGaN/GaN MQWs
err2023-05-01
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errOAAI
errMickevic, J.; Valkiunaite, E.; Podlipskas, Z.; Nomeika, K.; Nargelas, S.; Tamulaitis, G.; Chow, Y. C.; Nakamura, S.; Speck, J. S.; Weisbuch, C.; Aleksieju, R.
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Detection of hot electrons originating from an upper valley at ∼1.7 eV above the F valley in wurtzite GaN using electron emission spectroscopy使用电子发射光谱检测来自纤锌矿GaN中F谷上方〜1.7 eV的上谷的热电子
err2023-01-06
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errOAAI
errHo, Wan Ying; Alhassan, Abdullah I.; Lynsky, Cheyenne; Chow, Yi Chao; Myers, Daniel J.; DenBaars, Steven P.; Nakamura, Shuji; Peretti, Jacques; Weisbuch, Claude; Speck, James S.
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Impact of doped barriers on the recombination coefficients of c-plane InGaN/GaN single quantum well light-emitting diodes
err2022-11-01
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errOAAI
errChow, Y. C.; Lynsky, C.; Nakamura, S.; DenBaars, S. P.; Weisbuch, C.; Speck, J. S.
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Improved Vertical Carrier Transport for Green III-Nitride LEDs Using (In, Ga)N Alloy Quantum Barriers使用 (In,Ga)N合金量子势垒改善绿色III族氮化物led的垂直载流子传输
err2022-05-31
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errOAAI
errLynsky, Cheyenne; Lheureux, Guillaume; Bonef, Bastien; Qwah, Kai Shek; White, Ryan C.; DenBaars, Steven P.; Nakamura, Shuji; Wu, Yuh-Renn; Weisbuch, Claude; Speck, James S.
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Wigner-Weyl description of light absorption in disordered semiconductor alloys using the localization landscape theory
err2022-03-31
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errBanon, Jean-Philippe; Pelletier, Pierre; Weisbuch, Claude; Mayboroda, Svitlana; Filoche, Marcel
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Reduction of efficiency droop in c-plane InGaN/GaN light-emitting diodes using a thick single quantum well with doped barriers
err2021-11-29
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errOAAI
errChow, Y. C.; Lynsky, C.; Wu, F.; Nakamura, S.; DenBaars, S. P.; Weisbuch, C.; Speck, J. S.
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Quantitative correlation of hot electron emission to Auger recombination in the active region of c-plane blue III-N LEDs
err2021-08-04
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PREAI
errHo, Wan Ying; Chow, Yi Chao; Myers, Daniel J.; Wu, Feng; Peretti, Jacques; Weisbuch, Claude; Speck, James S.
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High efficiency blue InGaN microcavity light-emitting diode with a 205nm ultra-short cavity
err2021-01-21
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errBack, Joonho; Wong, Matthew S.; DenBaars, Steven P.; Weisbuch, Claude; Nakamura, Shuji
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Disorder effects in nitride semiconductors: impact on fundamental and device properties
err2020-11-18
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errOAAI
errWeisbuch, Claude; Nakamura, Shuji; Wu, Yuh-Renn; Speck, James S.
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Impact of Alloy-Disorder-Induced Localization on Hole Diffusion in Highly Excited c-Plane and m-Plane (In,Ga)N Quantum Wells
err2020-11-18
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errOAAI
errAleksiejunas, Ramunas; Nomeika, Kazimieras; Kravcov, Oleg; Nargelas, Saulius; Kuritzky, Leah; Lynsky, Cheyenne; Nakamura, Shuji; Weisbuch, Claude; Speck, James S.
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